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TC582562AXB
256-MBIT (32M x 8 BITS) CMOS NAND E2PROM
TC582562AXB Power supply VCC = 2.7 V to 3.6 V Program/Erase Cycles 1E5 cycle (with ECC) Access time
Cell array to register 25 µs max
Serial Read Cycle 50 ns min Operating current
Read (50 ns cycle) 10 mA typ.
Program (avg.) 10 mA typ. Erase (avg.) 10 mA typ.
Standby 100 µA Package P-TFBGA63-0911-0.80AZ (Weight: g typ.)
TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS
256-MBIT (32M × 8 BITS) CMOS NAND E2 PROM
DESCRIPTION The TC582562A is a single 3.3 V 256-Mbit (276,824,064) bit NAND Electrically Erasable and Programmable Read-Only Memory (NAND E2 PROM) organized as 528 bytes × 32 pages × 2048 blocks. The device has a 528-byte
static register which allows program and read data to be transferred between the register and the memory cell array
in 528-byte increments. The Erase operation is implemented in a single block unit (16 Kbytes + 512 bytes: 528 bytes
× 32 pages).
The TC582562A is a serial-type memory device which utilizes the I/O pins for both address and data input/output
as well as for command inputs. The Erase and Program operations are automatically executed making the device most suitable for applications such as solid-state file storage, voice recording, image file memory for still cameras
and other systems which require high-density non-volatile memory data storage.
FEATURES Organization
Memory cell allay 528 × 64K × 8 Register 528 × 8
Page size 528 bytes
Block size (16K + 512) bytes Modes
Read, Reset, Auto Page Program
Auto Block Erase, Status Read Mode control
Serial input/output
Command control
PIN ASSIGNMENT (TOP VIEW) PIN NAMES 1 2 3 4 5 6 7 8
E
H
J
K
000707EBA1
NU : Not used, NC : Not Connected
