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STF8NK85ZN/a40avaiN-CHANNEL 850V -1.1Ohm


STF8NK85Z ,N-CHANNEL 850V -1.1OhmAbsolute Maximum ratingsSymbol Parameter Value UnitTO-220 TO-220FPV Drain-source Voltage (V = 0)850 ..
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STF8NK85Z
N-CHANNEL 850V -1.1Ohm
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TARGET SPECIFICATION

March 2005
STP8NK85Z
STF8NK85Z

N-CHANNEL 850V -1.1Ω - 8.6A TO-220/TO-220FP
Zener-Protected SuperMESH™MOSFET
Rev. 2
STP8NK85Z - STF8NK85Z
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Table 3: Absolute Maximum ratings
) Pulse width limited by safe operating area
(1) ISD ≤6.7A, di/dt ≤200A/µs, V DD ≤ V(BR)DSS, Tj ≤ TJMAX.
(*) Limited only by maximum temperature allowed
Table 4: Thermal Data
Table 5: Avalanche Characteristics
Table 6: Gate-Source Zener Diode
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES

The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
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STP8NK85Z - STF8NK85Z
ELECTRICAL CHARACTERISTICS (TCASE =25°C UNLESS OTHERWISE SPECIFIED)
Table 7: On/Off
Table 8: DYNAMIC
Table 9: Source Drain Diode

Note:1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %. Pulse width limited by safe operating area. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80%
VDSS.
STP8NK85Z - STF8NK85Z
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Figure 3: Unclamped Inductive Load Test Cir-
cuit
Figure 5: Test Circuit For Inductive Load
Switching and Diode Recovery Times
Figure 6: Unclamped Inductive Wafeform

Figure 7: Gate Charge Test Circuit


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