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STD4NB40T4STN/a1700avaiN-CHANNEL 400V 1.47 OHM 4A DPAK/IPAK POWERMESH MOSFET
STD4NB40-T4 |STD4NB40T4STN/a15000avaiN-CHANNEL 400V 1.47 OHM 4A DPAK/IPAK POWERMESH MOSFET


STD4NB40-T4 ,N-CHANNEL 400V 1.47 OHM 4A DPAK/IPAK POWERMESH MOSFETELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)OFFSymbol Parameter Test Condi ..
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STD4NB40T4-STD4NB40-T4
N-CHANNEL 400V 1.47 OHM 4A DPAK/IPAK POWERMESH MOSFET
1/10June 2001
STD4NB40
STD4NB40-1

N-CHANNEL 400V - 1.47Ω - 4A DPAK/IPAK
PowerMESH™ MOSFET TYPICAL RDS(on) = 1.47 Ω EXTREMELY HIGH dv/dt CAPABILITY 100% AVALANCHE TESTED GATE CHARGE MINIMIZED ADD SUFFIX “T4” FOR ORDERING IN TAPE &
REEL
DESCRIPTION

Using the latest high voltage MESH OVERLAY™
process, STMicroelectronics has designed an ad-
vanced family of power MOSFETs with outstanding
performances. The new patent pending strip layout
coupled with the Company’s proprieraty edge termi-
nation structure, gives the lowest RDS(on) per area,
exceptional avalanche and dv/dt capabilities and
unrivalled gate charge and switching characteris-
tics.
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING SWITH MODE POWER SUPPLIES (SMPS) DC-DC CONVERTERS FOR TELECOM,
INDUSTRIAL, AND LIGHTING EQUIPMENT
ABSOLUTE MAXIMUM RATINGS

(•)Pulse width limited by safe operating area
(1) ISD≤ 4A, di/dt≤200 A/μs, VDD≤ V(BR)DSS, Tj≤TjMAX
STD4NB40/STD4NB40-1
THERMAL DATA
AVALANCHE CHARACTERISTICS
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)

OFF (1)
DYNAMIC
3/10
STD4NB40/STD4NB40-1
ELECTRICAL CHARACTERISTICS (CONTINUED)

SWITCHING ON
SWITCHING OFF
SOURCE DRAIN DIODE
Note:1. Pulsed: Pulse duration = 300 μs, duty cycle 1.5 %. Pulse width limited by safe operating area.
Thermal ImpedanceSafe Operating Area
STD4NB40/STD4NB40-1
Output Characteristics
Transconductance Static Drain-source On Resistance
Transfer Characteristics
Capacitance VariationsGate Charge vs Gate-source Voltage
5/10
STD4NB40/STD4NB40-1
Source-drain Diode Forward Characteristics
Normalized Gate Thereshold Voltage vs Temp. Normalized On Resistance vs Temperature
Fig. 5: Test Circuit For Inductive Load Switching
Fig. 4: Gate Charge test Circuit
Fig. 3: Switching Times Test Circuit For

Resistive Load
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