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SN74HC74MPWREP
Enhanced Product Dual D-Type Positive Edge Triggered Flip Flop With Clear And Preset
1FEATURES
SN74HC74-EP
DUAL D-TYPE POSITIVE EDGE TRIGGERED FLIP-FLOP
WITH CLEAR AND PRESETSCLS710–MARCH 2008
www.ti.com Controlled Baseline •
Wide Operating Voltage Rangeof2Vto6V One Assembly Site •
Outputs Can Drive upto 10 LSTTL Loads One Test Site •
Low Power Consumption,80 μA
Max ICC One Fabrication Site •
Typical tpd=15ns Extended Temperature Performance Driveat5V 125°C Currentof1 mA Max Enhanced Diminishing Manufacturing
(DMS) Support Enhanced Product-Change Notification Qualification Pedigree(1)
(1) Component qualificationin accordance with JEDEC
industry standardsto ensure reliable operation
extended temperature range. This includes,but
to, Highly Accelerated Stress Test (HAST)or biased 85/85,
temperature cycle, autoclaveor unbiased HAST, bond and mold Such qualification testingnot viewed use component
performance and environmental limits.
preset (PRE)or clear (CLR) inputs setsor resets the outputs, regardlessof the levelsof the other inputs. When
PRE and CLR are inactive (high), dataat the data (D) input meeting the setup time requirements are transferred
