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SN74BCT8245ADWRTEXAS INST ?N/a3319avaiIEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers
SN74BCT8245ADWRTIN/a253avaiIEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers


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SN74BCT8245ADWR
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers
SN54BCT8245A, SN74BCT8245A
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS043E − MAY 1990 − REVISED JULY 1996 Members of the Texas Instruments
SCOPE
™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F245 and
’BCT245 in the Normal- Function Mode
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Test Operation Synchronous to Test
Access Port (TAP)
Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V) on TMS Pin
SCOPE ™ Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST , CLAMP,
and HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation
From Outputs
− Sample Inputs/Toggle Outputs
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
and Ceramic 300-mil DIPs (JT, NT)

description

The ’BCT8245A scan test devices with octal bus
transceivers are members of the Texas
Instruments SCOPE™ testability integrated-
circuit family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F245 and ’BCT245 octal bus transceivers.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device
terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect
the functional operation of the SCOPE™ octal bus transceivers.
In the test mode, the normal operation of the SCOPE™ octal bus transceivers is inhibited and the test circuitry
is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SN54BCT8245A... JT PACKAGE
SN74BCT8245A ... DW OR NT PACKAGE
(TOP VIEW)
SN54BCT8245A...FK PACKAGE
(TOP VIEW)

NC − No internal connection
DIR
GND
TDO
TMS
VCC
TDI
TCK1 282713
TDI
TCK
TMS
TDO
DIR
42615161718B4
GNDB6B7A4A5NCVA6A7
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