Partno |
Mfg |
Dc |
Qty |
Available | Descript |
SN74BCT8244ANT |
TI|Texas Instruments |
N/a |
125 |
|
SCAN TEST DEVICES WITH OCTAL BUFFERS |
SN74BCT8244ANT , SCAN TEST DEVICES WITH OCTAL BUFFERS
SN74BCT8245ADWR ,IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus TransceiversSN54BCT8245A, SN74BCT8245ASCAN TEST DEVICESWITH OCTAL BUS TRANSCEIVERSSCBS043E − MAY 1990 − REVISED ..
SN74BCT8245ADWR ,IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus TransceiversSN54BCT8245A, SN74BCT8245ASCAN TEST DEVICESWITH OCTAL BUS TRANSCEIVERSSCBS043E − MAY 1990 − REVISED ..
SN74BCT8245ANT , SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8374ADW ,Scan Test Device With Octal D-Type Edge-Triggered Flip-FlopsSN54BCT8374A, SN74BCT8374ASCAN TEST DEVICESWITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPSSCBS045E − JU ..
SN74LVTH244APWRG4 ,3.3-V ABT Octal Buffers/Drivers With 3-State Outputs 20-TSSOP -40 to 85/sc/package.Please be aware that an important notice concerning availability, standard warranty, an ..
SN74LVTH244APWRG4 ,3.3-V ABT Octal Buffers/Drivers With 3-State Outputs 20-TSSOP -40 to 85/sc/package.Please be aware that an important notice concerning availability, standard warranty, an ..
SN74LVTH245A ,3.3-V ABT Octal Bus Transceivers With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..