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SN74BCT8244ANT , SCAN TEST DEVICES WITH OCTAL BUFFERS
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SN74BCT8244ADW
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers
SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E − FEBRUARY 1990 − REVISED JULY 1996
Members of the Texas Instruments
SCOPE™ Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to ’F244 and
’BCT244 in the Normal-Function Mode Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture Test Operation Synchronous to Test
Access Port (TAP) Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V) on TMS Pin SCOPE™ Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST , CLAMP
and HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation
From Outputs
− Sample Inputs/Toggle Outputs Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
and Ceramic 300-mil DIPs (JT, NT)
descriptionThe ’BCT8244A scan test devices with octal
buffers are members of the Texas Instruments
SCOPE™ testability integrated-circuit family. This
family of devices supports IEEE Standard
1149.1-1990 boundary scan to facilitate testing of
complex circuit-board assemblies. Scan access
to the test circuitry is accomplished via the 4-wire
test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F244 and ’BCT244 octal buffers. The test
circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPE™ octal buffers.
In the test mode, the normal operation of the SCOPE™ octal buffers is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations, as described in IEEE Standard 1149.1-1990.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1OE
1Y1
1Y2
1Y3
1Y4
GND
2Y1
2Y2
2Y3
2Y4
TDO
TMS
2OE
1A1
1A2
1A3
1A4
2A1
VCC
2A2
2A3
2A4
TDI
TCK
SN54BCT8244A... JT PACKAGE
SN74BCT8244A ... DW OR NT PACKAGE
(TOP VIEW)1282713
2A4
TDI
TCK
TMS
TDO
2Y4
1A2
1A1
2OE
1OE
1Y1
1Y2
1Y31Y4
GND
2Y12Y22Y3
1A31A42A1NCV2A22A3
SN54BCT8244A...FK PACKAGE
(TOP VIEW)NC − No internal connection
