SN74AUC2G53YZPR ,Single Pole, Double-Throw (SPDT) Analog Switch or 2:1 Analog Multiplexer/DemultiplexerFEATURESDCT OR DCU PACKAGE2• Available in the Texas Instruments NanoFree™(TOP VIEW)PackageCOM 1 8 V ..
SN74AUC2G66DCTR ,Dual Bilateral Analog SwitchFEATURESDCT OR DCU PACKAGE• Available in the Texas Instruments(TOP VIEW)NanoFree™ Package1A 1 8 V• ..
SN74AUC2G66DCUR ,Dual Bilateral Analog SwitchElectrical Characteristicsover recommended operating free-air temperature range (unless otherwise n ..
SN74AUC2G80DCTR ,Dual Positive-Edge-Triggered D-Type Flip-FlopFEATURES• Available in the Texas Instruments • Low Power Consumption, 10-μA Max ICCNanoFree™ Packag ..
SN74AUC2G80YZPR ,Dual Positive-Edge-Triggered D-Type Flip-Flop/sc/package.(2) DCT: The actual top-side marking has three additional characters that designate the ..
SN74AUC2GU04DCKR ,Dual Inverter GateFEATURES• Available in the Texas Instruments • Low Power Consumption, 10 μA at 1.8 VNanoFree™ Packa ..
SN74LVT125PW ,3.3-V ABT Quadruple Bus Buffers With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74LVT125PWR ,3.3-V ABT Quadruple Bus Buffers With 3-State Outputslogic diagram (positive logic)11OE231A 1Y42OE562A 2Y103OE983A 3Y134OE12 114A 4Y†absolute
SN74LVT162244ADGGR ,3.3-V ABT 16-Bit Buffers/Drivers With 3-State OutputsSCBS718D–JUNE 2000–REVISED DECEMBER 2006DESCRIPTION/ORDERING INFORMATION (CONTINUED)ORDERING INFORM ..
SN74LVT162244ADGGR ,3.3-V ABT 16-Bit Buffers/Drivers With 3-State OutputsFEATURESSN54LVT162244A . . . WD PACKAGE• Members of the Texas Instruments Widebus™SN74LVT162244A . ..
SN74LVT162244ADL ,3.3-V ABT 16-Bit Buffers/Drivers With 3-State OutputsSCBS718D–JUNE 2000–REVISED DECEMBER 2006(1)GRD OR ZRD PACKAGETERMINAL ASSIGNMENTS(TOP VIEW)(54-Ball ..
SN74LVT162245ADGGR ,3.3-V ABT 16-Bit Bus Transceivers With 3-State Outputs/sc/package.(2) Product previewGQL OR ZQL PACKAGE (1)TERMINAL ASSIGNMENTS(TOP VIEW)(56-Ball GQL/ZQL ..
SN74AUC2G53YZPR
Single Pole, Double-Throw (SPDT) Analog Switch or 2:1 Analog Multiplexer/Demultiplexer
SN74AUC2G53 www.ti.com ................................................................................................................................................ SCES484C–AUGUST 2003–REVISED JANUARY 2009 SINGLE-POLE DOUBLE-THROW (SPDT) ANALOG SWITCH OR 2:1 ANALOG MULTIPLEXER/DEMULTIPLEXER 1FEATURES DCT OR DCU PACKAGE 2 • Available in the Texas Instruments NanoFree™ (TOP VIEW) Package COM 1 8 V • Operates at 0.8 V to 2.7 V CC INH 2 7 Y1 • Sub-1-V Operable GND Y2 3 6 • Low Power Consumption, 10 μA at 2.7 V GND A 4 5 • High On-Off Output Voltage Ratio • High Degree of Linearity YZP PACKAGE • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II D D • ESD Protection Exceeds JESD 22 C C – 2000-V Human-Body Model (A114-A) B B – 200-V Machine Model (A115-A) A A – 1000-V Charged-Device Model (C101) 2 1 1 2 Laser Marking View Bump View YZP TERMINAL ASSIGNMENTS D GND A C GND Y2 B INH Y1 A COM V CC 1 2 DESCRIPTION/ORDERING INFORMATION This analog switch is operational at 0.8-V to 2.7-V V , but is designed specifically for 1.1-V to 2.7-V V CC CC operation. The SN74AUC2G53 can handle both analog and digital signals. The device permits signals with amplitudes of up to V (peak) to be transmitted in either direction. CC NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package. Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2NanoFree is a trademark of Texas Instruments. PRODUCTION DATA information is current as of publication date. Copyright © 2003–2009, Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
