SN74ABT18502 ,Scan Test Devices With 18-Bit Universal Bus Transceiver SN74ABT18502 SCAN TEST DEVICEWITH 18-BIT REGISTERED BUS TRANSCEIVERSCBS753 – FEBRUARY 2002* Member ..
SN74ABT18504 ,Scan Test Devices With 20-Bit Universal Bus Transceivers SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUG ..
SN74ABT18504PM ,Scan Test Devices With 20-Bit Universal Bus Transceivers SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUG ..
SN74ABT18640DL ,Scan Test Devices With 18-Bit Inverting Bus TransceiversSN54ABT18640, SN74ABT18640 SCAN TEST DEVICESWITH 18-BIT INVERTING BUS TRANSCEIVERSSCBS267C – FEBRUA ..
SN74ABT18646 ,Scan Test Devices With 18-Bit Bus Transceivers And Registers SN74ABT18646 SCAN TEST DEVICEWITH 18-BIT TRANSCEIVER AND REGISTERSCBS131A – AUGUST 1992 – REVISED ..
SN74ABT2240A ,Octal Buffers And Line/MOS Drivers With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74LS125A ,LOW POWER SCHOTTKYmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74LS125AD ,Quad 3-state buffermaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74LS125ADBR ,Quadruple Bus Buffers With 3-State Outputslogic diagram (each gate)’125, ’LS125AGAY’126, ’LS126AGAYY = A2POST OFFICE BOX 655303 • DALLAS, TEX ..
SN74LS125ADBR ,Quadruple Bus Buffers With 3-State Outputsmaximum ratings over operating free-air temperature (unless otherwise noted)(’125 and ’126) Supply ..
SN74LS125ADR ,Quadruple Bus Buffers With 3-State OutputsSN54125, SN54126, SN54LS125A, SN54LS126A, SN74125, SN74126, SN74LS125A, SN74LS126AThe SN54125, SN54 ..
SN74LS125AML1 ,Quad 3-State Buffers
SN74ABT18502
Scan Test Devices With 18-Bit Universal Bus Transceiver
Clocked Mode Compatible With IEEE Std 1149.1-1990
(JTAG) Test Access Port (TAP) and
Boundary-Scan Architecture Includes D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data Two Boundary-Scan Cells (BSCs) Per I/O
for Greater Flexibility
Inputs With Masking Option
– Pseudorandom Pattern Generation
(PRPG) From Outputs
– Sample Inputs/Toggle Outputs (TOPSIP)
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes1OEABGND 1CLKABTDO1A21A1 1LEAB V 1LEBA1OEBA 1B11B2TMS1CLKBA GND 1B3
2A9
GND
2LEAB
2CLKAB
2A72A8
2OEAB
TDI
2CLKBA
2LEBA
2OEBA
2B9
TCK
GND
2B8
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
VCC
2A1
2A2
2A3
GND
2A4
2A5
2A6
1B4
1B5
1B6
GND
1B7
1B8
1B9
VCC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
PM PACKAGE
(TOP VIEW)Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
