SCAN926260TUFX ,3.0 V to 3.6 V, six 1 to 10 bus LVDS deserializer with IEEE 1149.1 and at-speed BISTfeatures an At-Speed Built-In Self Testn On chip filtering for PLL(BIST).Formoredetails,pleaseseeth ..
SCAN928028TUF ,8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BISTElectrical CharacteristicsOver recommended operating supply and temperature ranges unless otherwise ..
SCAN928028TUF ,8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BISTapplications. Each serializer block in the10-bit Serializer devicesSCAN928028 operates independentl ..
SCAN928028TUF/NOPB ,8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85Electrical Characteristics(1)(2)Over recommended operating supply and temperature ranges unless oth ..
SCAN92LV090SLC ,9 Channel Bus LVDS Transceiver w/ Boundary SCANfeaturesaflowthroughpinoutn High Signaling Rate Capability (above 100 Mbps)which allows easy PCB ro ..
SCAN92LV090VEH ,9 Channel Bus LVDS Transceiver w/ Boundary SCANFeaturesates from a single 3.3V power supply and includes ninen IEEE 1149.1 (JTAG) Compliantdiffere ..
SFR9230B ,200V P-Channel MOSFETFeaturesThese P-Channel enhancement mode power field effect • -5.4A, -200V, R = 0.6Ω @V = -10 VDS(o ..
SFS2955 ,P-CHANNEL POWER MOSFETFEATURESBV = -60 VDSS! Avalanche Rugged TechnologyR = 0.3 ΩDS(on) ! Rugged Gate Oxide Techn ..
SFS9620 ,Advanced Power MOSFETFEATURESBV = -200 VDSS Avalanche Rugged TechnologyR = 1.5 ΩDS(on) Rugged Gate Oxide T ..
SFS9624 ,Advanced Power MOSFETFEATURESBV = -250 VDSS Avalanche Rugged TechnologyR = 2.4 ΩDS(on) Rugged Gate Oxide T ..
SFS9630 ,Advanced Power MOSFETFEATURESBV = -200 VDSS Avalanche Rugged TechnologyR = 0.8 ΩDS(on) Rugged Gate Oxide T ..
SFS9634 ,Advanced Power MOSFETSFS9634Advanced Power MOSFET
SCAN926260TUFX
3.3 V, dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG) and at-speed BIST
SCAN926260
Six 1 to 10 Bus L VDS Deserializers with IEEE 1149.1 and
At-Speed BIST
General DescriptionThe SCAN926260 integratessix 10-bit deserializer devices
intoa single chip. The SCAN926260 can simultaneously
deserializeuptosix data streams that have been serialized National Semiconductor’s 10-bit Bus LVDS serializers.In
addition,the SCAN926260is compliant with IEEE standard
1149.1 and also featuresan At-Speed Built-In Self Test
(BIST). For more details,please seethe sections titled "IEEE
1149.1 Test Modes" and "BIST Alone Test Modes."
Each deserializer blockin the SCAN926260 hasit’s own
powerdown pin (PWRDWN[n])and operates independently
withits own clock recovery circuitry and lock-detect signal-
ing.In addition,a master powerdown pin (MS_PWRDWN)
which putsallthe entire device into sleep modeis provided.
The SCAN926260 usesa single +3.3V power supply and
consumes 1.2Wat 3.3V witha PRBS-15 patternonall
channelsat 660Mbps.
Features Deserializes onetosix Bus LVDS input serial data
streams with embedded clocks IEEE 1149.1 (JTAG) Compliant and At-Speed BIST test
modes Parallel clock rate 16-66MHz On chip filteringfor PLL High impedance inputs upon poweroff (Vcc= 0V) Single power supplyat +3.3V 196-pin LBGA package (Low-profile Ball Grid Array)
package Industrial temperature range operation: −40˚Cto +85˚C ROUTn[0:9] and RCLKn default high when channelis
not locked Powerdown per channelto conserve poweron unused
channels
Typical ApplicationOrdering Information
Order Number Function Package
SCAN926260TUF Six Channel 10-bit BLVDS Deserializer
with IEEE 1149.1 and At-Speed BIST
UJB196A (Trays)
SCAN926260TUFX Six Channel 10-bit BLVDS Deserializer
with IEEE 1149.1 and At-Speed BIST
UJB196A (Tape and Reel)
July 2004
SCAN926260
Six
Bus
VDS
Deserializers
with
IEEE
and
At-Speed
BIST
