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NUS2401SNT1ONN/a12000avaiIntegrated PNP/NPN Digital Transistors Array
NUS2401SNT1GONN/a10773avaiIntegrated PNP/NPN Digital Transistors Array


NUS2401SNT1 ,Integrated PNP/NPN Digital Transistors ArrayELECTRICAL CHARACTERISTICS(Unless otherwise noted: T = 25°C for typical values, common for Q1, Q2, ..
NUS2401SNT1G ,Integrated PNP/NPN Digital Transistors Array2NUS2401SNT1400 1350300250 T = −25°CA0.1 75°C20015025°C100 R = 357°C/WJA50I /I = 10C B0.010−50 0 5 ..
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NUS2401SNT1-NUS2401SNT1G
Integrated PNP/NPN Digital Transistors Array
NUS2401SNT1
Integrated PNP/NPN Digital
Transistors Array
This new option of integrated digital transistors is designed to
replace a discrete solution array of three transistors and their external
resistor bias network. BRTs (Bias Resistor Transistors) contain a
single transistor with a monolithic bias network consisting of two
resistors; a series base resistor and a base−emitter resistor. The BRT
technology eliminates these individual components by integrating
them into a single device, therefore the integration of three BRTs
results in a significant reduction of both system cost and board space.
This new device is packaged in the SC−74/Case 318F package which
is designed for low power surface mount applications.
Features
Integrated Design Reduces Board Space and Components Count Simplifies Circuitry Design Offered in Surface Mount Package Technology (SC−74) Available in 3000 Unit Tape and Reel Pb−Free Package is Available
Typical Applications
Audio Muting Applications Drive Circuits Applications Industrial: Small Appliances, Security Systems, Automated Test Consumer: TVs and VCRs, Stereo Receivers, CD Players,
Cassette Recorders
MAXIMUM RATINGS (Maximum Ratings are those values beyond which

damage to the device may occur. Electrical Characteristics are not
guaranteed over this range.)
THERMAL CHARACTERISTICS

Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits
are exceeded, device functional operation is not implied, damage may occur
and reliability may be affected.
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