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MC74F579
8-BIT BIDIRECTIONAL BINARY COUNTER (3-STATE)
features a presetcapability for programmable operation, carry look-ahead for easy cascading8-BIT BIDIRECTIONALand a U/D input to control the direction of counting. All state changes, exceptBINARY COUNTER (3-STATE)for the case of asynchronous reset, are initiated by the rising edge of the clock.FAST SCHOTTKY TTLTC output is not recommended for use as a clock or asynchronous reset dueto the possibility of decoding spikes.• Multiplexed 3-State I/O Ports For Bus-oriented Applications• Built-In Cascading Carry Capability• Count Frequency 115 MHz Typ• Supply Current 100 mA TypJ SUFFIX• Fully Synchronous OperationCERAMIC• U/D Pin to Control Direction of Counting CASE 732-0320• Separate Pins for Master Reset and Synchronous Reset1• Center Power Pins to Reduce Effects of Package Inductance• See F269 for 24-Pin Separate I/O Port VersionN SUFFIX• See F779 for 16-Pin VersionPLASTIC• ESD Protection > 4000 VoltsCASE 738-0320PIN ASSIGNMENT1MR SR CEP CET V TC U/D PE CS OECC20 19 18 17 16 15 14 13 12 11DW SUFFIXSOIC20CASE 751D-0311 2 3 4 5 6 7 8 9 10 ORDERING INFORMATIONCP I/O I/O I/O I/O GND I/O I/O I/O I/O0 1 2 3 4 5 6 7MC74FXXXJ CeramicMC74FXXXN PlasticLOGIC SYMBOLMC74FXXXDW SOIC13 12 20 19 14PE CS MR SR U/D1 CP18 CEPTC 1517 CET11 OEI/O I/O I/O I/O I/O I/O I/O I/O0 1 2 3 4 5 6 72 3 4 5 6 7 8 9GUARANTEED OPERATING RANGESSymbol Parameter Min Typ Max UnitV Supply Voltage 4.5 5.0 5.5 VCCT Operating Ambient Temperature Range 0 25 70 °CATC –1.0II Output Current — High Output Current — High mA mAO OH HI/O –3.0nTC 20II Output Current — Low Output Current — Low mA mAO OL LI/O 24nFAST AND LS TTL DATA4-229MC74F579FUNCTION TABLEMR SR CS PE CEP CET U/D OE CP FunctionX X H X X X X X X I/O to I/O in Hi-Z (PE disabled)0 7X X L H X X X H X I/O to I/O in Hi-Z0 7X X L H X X X L X Flip-Flop outputs appear on I/O linesL X X X X X X X X Asynchronous reset for all flip-flopsH L X X X X X X ↑ Synchronous reset for all flip-flopsH H L L X X X X ↑ Parallel load all flip-flopsH H (not LL) H X X X ↑ HoldH H (not LL) X H X X ↑ Hold (TC held high)H H (not LL) L L H X ↑ Count upH H (not LL) L L L X ↑ Count downH = High voltage level L = Low voltage levelX = Don’t care ↑ = Low-to-High clock transition(not LL) = CS and PE should never both be low voltage at the same timeDC CHARACTERISTICS OVER OPERATING TEMPERATURE RANGE (unless otherwise specified)74FT Test Conditions est ConditionsSymbol Symbol Parameter Parameter Unit Unit(Note 1) (Note 1)Min Typ (2) MaxI = –1.0 mA2.5 OH V = 4.5 VCCV V = MAX = MAXTC TC V VIIL L2.7 3.4 V V = MIN = MIN V = 4.75 VIIH H CCV V V Output HIGH V Output HIGH V Output HIGH Voltage oltage oltageO O OH H HI = –3.0 mA2.4 3.3 V = 4.5 VOHCCI/O I/O V V V V = MAX = MAXn n IIL L2.7 3.3 V = 4.75 VV V = MIN = MINCCIIH HV = 4.5 VTC I = 20 mA CCOLV V = MAX = MAXV V Output LOW V Output LOW Voltage oltage 0.35 0.35 0.5 0.5 V VIIL LO OL LI/O I = 24 mA V V = MIN = MINn OL IIH HV Input Clamp Diode Voltage –0.73 –1.2 V V = 4.5 V, I = –18 mAIK CC INI/O 1.0 mA V = 5.5 Vn INV V = 5.5 V = 5.5 VC CC Cothers 100 μA V = 7.0 VINIII Input HIGH Current Input HIGH Current Input HIGH CurrentIIIH H HI/O 70nμ μA A V V = 5.5 V = 5.5 V, V , V = 2.7 V = 2.7 VC CC C IIN Nothers 20ExceptI Input LOW Current –0.6 mA V = 5.5 V, V = 0.5 VIL CC INI/OnOFF-State CurrentI 70 V = 2.7 VOZH OUTHigh-Level Voltage AppliedI/O I/O μ μA A V V = 5.5 V = 5.5 Vn n C CC COFF-State CurrentI –600 V = 0.5 VOZL OUTLow-Level Voltage AppliedI Output Short Circuit Current (Note 3) –60 –80 –150 mA V = MAX, V = 0 VOS CC OUTI 95 135CCHII T Total Supply Current (total) otal Supply Current (total) I 105 145 mA mA V V = MAX = MAX = MAXC C CC C C CCL C C CC C CI 105 150CCZNOTES:1. For conditions shown as MIN or MAX, use the appropriate value specified under guaranteed operating conditions for the applicable device type.2. All typical values are at V = 5.0 V, T = 25°C.CC A3. Not more than one output should be shorted at a time. For I testing, the use of high-speed test apparatus and/or sample-and-hold techniques are prefer-OSable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a HIGH output may raise the chiptemperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, I tests should be per-OSformed last.FAST AND LS TTL DATA4-230MC74F579AC
