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M27256STN/a4390avaiNND


M27256 ,NNDM27256NMOS 256 Kbit (32Kb x 8) UV EPROMNOT FOR NEW DESIGN

M27256
NND
1/10
NOT FOR NEW DESIGN

November 2000
M27256

NMOS 256 Kbit (32Kb x 8) UV EPROM FAST ACCESS TIME: 170ns EXTENDED TEMPERATURE RANGE SINGLE 5V SUPPLY VOLTAGE LOW STANDBY CURRENT: 40mA max TTL COMPATIBLE DURING READ and
PROGRAM FAST PROGRAMMING ALGORITHM ELECTRONIC SIGNATURE PROGRAMMING VOLTAGE: 12V
DESCRIPTION

The M27256 is a 262,144 bit UV erasable and
electrically programmable memory EPROM. It is
organized as 32.768 words by 8 bits.
The M27256 is housed in a 28 pin Window Ceram-
ic Frit-Seal Dual-in-Line package. The transparent
lid allows the user to expose the chip to ultraviolet
light to erase the bit pattern. A new pattern can
then be written to the device by following the pro-
gramming procedure.
Figure 2. DIP Pin Connections
Note: Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause

permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those
indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods
may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents.
Table 2. Absolute Maximum Ratings
DEVICE OPERATION

The eight modes of operations of the M27256 are
listed in the Operating Modes Table. A single 5V
power supply is required in the read mode. All
inputs are TTL levels except for VPP and 12V on A9
for Electronic Signature.
Read Mode

The M27256 has two control functions, both of
which must be logically satisfied in order to obtain
data at the outputs. Chip Enable (E) is the power
control and should be used for device selection.
Output Enable (G) is the output control and should
be used to gate data to the output pins, inde-
pendent of device selection. Assuming that the
addresses are stable, address access time (tAVQV)
is equal to the delay from E to output (tELQV). Data
is available at the outputs after the falling edge of
G, assuming that E has been low and the ad-
dresses have been stable for at least tAVQV-tGLQV.
Standby Mode

The M27256 has a standby mode which reduces
the maximum active power current from 100mA to
40mA. The M27256 is placed in the standby mode
by applying a TTL high signal to the E input. When
in the standby mode, the outputs are in a high
impedance state, independent of the G input.
Two Line Output Control

Because EPROMs are usually used in larger mem-
ory arrays, this product features a 2 line control
function which accommodates the use of multiple
memory connection. The two line control function
allows: the lowest possible memory power dissipation, complete assurance that output bus contention
will not occur.
M27256
For the most efficient use of these two control lines, should be decoded and used as the primary
device selecting function, while G should be made
a common connection to all devices in the array
and connected to the READ line from the system
control bus.
This ensures that all deselected memory devices
are in their low power standby mode and that the
output pins are only active when data is required
from a particular memory device.
System Considerations

The power switching characteristics of fast
EPROMs require careful decoupling of the devices.
The supply current, ICC, has three segments that
are of interest to the system designer : the standby
current level, the active current level, and transient
current peaks that are produced by the falling and
rising edges of E. The magnitude of the transient
current peaks is dependent on the capacitive and
inductive loading of the device at the output. The
associated transient voltage peaks can be sup-
pressed by complying with the two line output
control and by properly selected decoupling ca-
pacitors. It is recommended that a 1μF ceramic
capacitor be used on every device between VCC
and VSS. This should be a high frequency capacitor
of low inherent inductance and should be placed
as close to the device as possible. In addition, a
4.7μF bulk electrolytic capacitors should be used
between VCC and VSS for every eight devices. The
bulk capacitor should be located near the power
supply connection point. The purpose of the bulk
capacitor is to overcome the voltage drop caused
by the inductive effects of PCB traces.
Programmain

When delivered, (and after each erasure for UV
EPROM), all bits of the M27256 are in the “1" state.
Data is introduced by selectively programming ”0s"
into the desired bit locations. Although only “0s” will
be programmed, both “1s” and “0s” can be present
in the data word. The only way to change a “0" to
a ”1" is by ultraviolet light erasure. The M27256 is
in the programming mode when VPP input is at
12.5V and E is at TTL low. The data to be pro-
grammed is applied 8 bits in parallel to the data
output pins. The levels required for the address and
data inputs are TTL.
Fast Programming Algorithm

Fast Programming Algorithm rapidly programs
M27256 EPROMs using an efficient and reliable
method suited to the production programming en-
vironment. Programming reliability is also ensured
as the incremental program margin of each byte is
continually monitored to determine when it has
been successfully programmed. A flowchart of the
M27256 Fast Programming Algorithm is shown on
the Flowchart. The Fast Programming Algorithm
utilizes two different pulse types : initial and over-
program. The duration of the initial E pulse(s) is
1ms, which will then be followed by a longer over-
program pulse of length 3ms by n (n is equal to the
number of the initial one millisecond pulses applied
Note: X = VIH or VIL, VID = 12V ± 0.5%.
Table 3. Operating Modes
Table 4. Electronic Signature
DEVICE OPERATION (cont’d)
M27256

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Figure 3. AC Testing Input Output Waveforms
Input Rise and Fall Times ≤ 20ns
Input Pulse Voltages 0.45V to 2.4V
Input and Output Timing Ref. Voltages 0.8V to 2.0V
AC MEASUREMENT CONDITIONS
Figure 4. AC Testing Load Circuit

Note that Output Hi-Z is defined as the point where data
is no longer driven.
Note:
1. Sampled only, not 100% tested.
Table 5. Capacitance (1)
(TA = 25 °C, f = 1 MHz )
Figure 5. Read Mode AC Waveforms
M27256
Table 7A. Read Mode AC Characteristics (1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC = 5V ± 5% or 5V ± 10%; VPP = VCC)
Note:
1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
Table 6. Read Mode DC Characteristics (1)

(TA = 0 to 70 °C or –40 to 85 °C; VCC = 5V ± 5% or 5V ± 10%; VPP = VCC)
Notes:1.
VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP. Sampled only, not 100% tested.
Table 7B. Read Mode AC Characteristics (1)

(TA = 0 to 70 °C or –40 to 85 °C; VCC = 5V ± 5% or 5V ± 10%; VPP = VCC)
M27256

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Note. 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
Table 8. Programming Mode DC Characteristics (1)

(TA = 25 °C; VCC = 6V ± 0.25V; VPP = 12.5V ± 0.3V)
Notes. 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.

2. The Initial Program Pulse width tolerance is 1 ms ± 5%.
3. The length of the Over-program Pulse varies from 2.85 ms to 78.95 ms, depending on the multiplication value of the iteration counter.
4. Sampled only, not 100% tested.
Table 9. Programming Mode AC Characteristics (1)

(TA = 25 °C; VCC = 6V ± 0.25V; VPP = 12.5V ± 0.3V)
M27256
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