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LM7171AIMNSCN/a11avaiVery High Speed, High Output Current, Voltage Feedback Amplifier
LM7171AIMXNSN/a556avaiVery High Speed, High Output Current, Voltage Feedback Amplifier


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LM7171AIM-LM7171AIMX
Very High Speed, High Output Current, Voltage Feedback Amplifier
Original Creation Date: 03/16/00
Last Update Date: 08/02/01
Last Major Revision Date: 03/16/00MNLM7171AM-X-RH REV 0C0
MICROCIRCUIT DATA SHEET
VERY HIGH SPEED, HIGH OUTPUT CURRENT, VOLTAGE FEEDBACK
AMPLIFIER: ALSO AVAILABLE GUARANTEED TO 300K RAD(Si)
TESTED TO MIL-STD-883, METHOD 1019.5
General Description

The LM7171 is a high speed voltage feedback amplifier that has the slewing characteristic
of a current feedback amplifier; yet it can be used in all traditional voltage feedback
amplifier configurations. The LM7171 is stable for gains as low as + 2 or -1. It provides
a very high slew rate at 2000V/uS (Minimum) and a wide gain-bandwidth product of 170MHz
(Minimum) while consuming only 6.5mA of supply current. It is ideal for video and high
speed signal processing applications such as HDSL and pulse amplifiers. With 100mA output
current, the LM7171 can be used for video distribution, as a transformer driver, or as a
laser diode driver.
Operation on +15V power supplies allows for large signal swings and provides greater
dynamic range and signal-to-noise ratio. The LM7171 is ideal for ADC/DAC systems. In
addition, the LM7171 is specified for +5V operation for portable applications.
The LM7171 is built on National's advanced VIP(TM)III(Vertically integrated PNP)
complementary bipolar process.
NS Part Numbers

LM7171AMJ-QML
LM7171AMJ-QMLV
LM7171AMJFQML
LM7171AMJFQMLV
LM7171AMW-QML
LM7171AMW-QMLV
LM7171AMWFQMLV
LM7171AMWG-QML
LM7171AMWG-QMLV
LM7171AMWGFQML
LM7171AMWGFQMLV
Industry Part Number

LM7171AM
Prime Die

LM7171
Controlling Document

See Features Section
Processing

MIL-STD-883, Method 5004
Quality Conformance Inspection

MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
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