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LM556CMNSCN/a1455avaiDual Timer
LM556CN国半N/a53avaiDual Timer


LM556CM ,Dual TimerMICROCIRCUIT DATA SHEETOriginal Creation Date: 08/02/95MNLM556-X REV 0BLLast Update Date: 11/12/98L ..
LM556CMX ,Dual TimerLM556 Dual TimerMarch 2000LM556Dual Timer
LM556CN ,Dual TimerMICROCIRCUIT DATA SHEETOriginal Creation Date: 08/02/95MNLM556-X REV 0BLLast Update Date: 11/12/98L ..
LM556J ,18 V, dual timerGeneral Description The LM556 Dual timing circuit is a highly stable Controller capable of prod ..
LM556J ,18 V, dual timerApplications I Precision timing I Pulse generation I Sequential timing I Time delay gen ..
LM556J-MIL ,Dual TimerLM556 Dual TimerMarch 2000LM556Dual Timer
LP2996LQ ,DDR Termination RegulatorFeaturesn Source and sink currentThe LP2996 linear regulator is designed to meet the JEDECSSTL-2 sp ..
LP2996LQX ,DDR Termination RegulatorFeaturesn Source and sink currentThe LP2996 linear regulator is designed to meet the JEDECSSTL-2 sp ..
LP2996LQX ,DDR Termination RegulatorLP2996 DDR Termination RegulatorNovember 2003LP2996DDR Termination Regulator
LP2996LQXNOPB ,1.5A DDR Termination Regulator with Shutdown Pin 16-WQFN 0 to 125Maximum Ratings.. 510.3 Thermal Considerations.... 206.2 ESD Ratings........ 511 Device and Documen ..
LP2996M ,DDR Termination RegulatorFeaturesn Source and sink currentThe LP2996 linear regulator is designed to meet the JEDECSSTL-2 sp ..
LP2996M/NOPB ,1.5A DDR Termination Regulator with Shutdown Pin 8-SOIC 0 to 125Maximum Ratings... 5• Changed Thermal Resistance, R , values in Thermal Information From: 151°C/W T ..


LM556CM-LM556CN
Dual Timer
Original Creation Date: 08/02/95
Last Update Date: 11/12/98
Last Major Revision Date: 08/02/95MNLM556-X REV 0BL
MICROCIRCUIT DATA SHEET
DUAL TIMER
NS Part Numbers

LM556J-MIL
Industry Part Number

LM556
Prime Die

LMJ556
Processing

MIL-STD-883, Method 5004
Quality Conformance Inspection

MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
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