LM193AH ,Low Power Low Offset Voltage Dual ComparatorGeneral Description Advantagesn High precision comparatorsThe LM193 series consists of two independ ..
LM193AH ,Low Power Low Offset Voltage Dual ComparatorMICROCIRCUIT DATA SHEETOriginal Creation Date: 05/18/95MNLM193A-X REV 1B3Last Update Date: 06/14/04 ..
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LM193AH-LM193AJ/883-LM193H/883
Low Power Low Offset Voltage Dual Comparator
Original Creation Date: 05/18/95
Last Update Date: 06/14/04
Last Major Revision Date: 09/02/97
MNLM193A-X REV 1B3
MICROCIRCUIT DATA SHEET
LOW POWER LOW OFFSET VOLTAGE DUAL COMPARATORS
General DescriptionThe LM193A consists of two independent precision voltage comparators with an offset
voltage specification as low as 2.0mV max for two comparators which were designed
specifically to operate from a single power supply over a wide range of voltages.
Operation from split power supplies is also possible and the low power supply current
drain is independent of the magniture of the power supply voltage. These comparators also
have a unique characteristic in that the input common-mode voltage range includes ground,
even though operated from a single power supply voltage.
Application areas include limit comparators, simple analog to digital converters; pulse,
squarewave and time delay generators; wide range VCO; MOS clock timers; multivibrators and
high voltage digital logic gates. The LM193A was designed to directly interface with TTL
and CMOS. When operated from both plus and minus power supplies, the LM193A will directly
interface with MOS logic where their low power drain is a distinct advantage over standard
comparators.
NS Part NumbersLM193AH-QMLV
LM193AH/883
LM193AJ-QMLV
LM193AJ/883
Industry Part NumberLM193A
Prime DieLM193A
Controlling DocumentSee Features Page
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
