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IRFD320IORN/a62avai400V Single N-Channel HEXFET Power MOSFET in a HEXDIP package


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IRFD320
400V Single N-Channel HEXFET Power MOSFET in a HEXDIP package
International
IOR Rectifier
PD -9.1226
IRFD320
HEXFET® Power MOSFET
q Dynamic dv/dt Rating
0 Repetitive Avalanche Rated L)
o For Automatic Insertion VDSS = 400V
. End Stackable
. Fast Switching " RDS(on) = 1.89
. Ease of paralleling G
q Simple Drive Requirements ID = 0.49A
Description
Third Generation HEXFETs from International Rectifier provide the designer
with the best combination of fast switching, ruggedized device design, low on-
resistance and cost-effectiveness.
The 4-pin DIP package is a Iow-cost machine-insertable case style which can be
stacked in multiple combinations on standard 0.1 inch pin centers. The dual drain
serves as a thermal link to the mounting surface for power dissipation levels up to
1 watt.
Absolute Maximum Ratings
Parameter Max. Units
ID @ Tc = 25''C Continuous Drain Current, VGS @ 10 V 0.49
ID @ Tc = 100°C Continuous Drain Current, VGs @ 10 V 0.31 A
IDM Pulsed Drain Current OD 3.9
Pro @Tc = 25''C Power Dissipation 1.0 W
Linear Derating Factor 0.0083 W/''C
VGs Gate-to-Source Voltage I20 V
EAS Single Pulse Avalanche Energy © 48 mJ
IAR Avalanche Current© 0.49 A
EAR Repetitive Avalanche Energy (D 0.10 m]
dv/dt Peak Diode Recovery dv/dt © 4.0 V/ns
To Operating Junction and -55 to + 150
TSTG Storage Temperature Range °C
Soldering Temperature, for 10 seconds 300 (1.6mm from case)
Thermal Resistance
Parameter
Min. Typ. Max. Units
Junction-to-Ambient
- - 120 "CAN
Revision 0
IRFD320 TOR
Electrical Characteristics @ ll = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 400 - - V VGS = 0V, ID = 250PA
AV(BR)Dss/ATJ Breakdown Voltage Temp. Coemcient - 0.51 - V/°C Reference to 25°C, ID = 1mA
RDS(on) Static Drain-to-Source On-Resistance - - 1.8 Q VGS = 10.0V, ID = 0.21A ©
- - Vss = V, ID = A ©
Vegan) Gate Threshold Voltage 2.0 - 4.0 V VDs = Was, 10 = 250pA
gfs Forward Transconductance 1.7 - - S Vos = 50V, ID = 1.2A
loss Drain-to-Source Leakage Current - - 25 Vos = 400V, VGS = 0V
- - 250 pA Vros = 320v, VGS = 0v, Tu = 125°C
less Gate-to-Source Forward Leakage - - 100 I/ss = 20V
Gate-to-Source Reverse Leakage - - -100 nA l/ss = -20V
% Total Gate Charge - - 20 ID = 2.0A
Qgs Gate-to-Source Charge - - 3.3 nC Vos = 320V
di Gate-to-Drain ("Miller") Charge - - 11 VGS = 10V, See Fig. 6 and 13 G)
tam) Turn-On Delay Time - 10 - VDD = 200V
tr Rise Time - 14 - ns ID = 3.3A
td(ott) Turn-Off Delay Time - 30 - Rs = 189
If Fall Time - 13 - Ro = 56n, See Fig. 10 ©
u, Internal Drain Inductance - 4.0 - Between lead, D
6mm (0.25in.)
Ls Internal Source Inductance - 6.0 - nH from package G J
and center of
die contact C
Ciss Input Capacitance - 410 - VGS = 0V
CDSS Output Capacitance - 120 - pF I/rss = 25V
Crss Reverse Transfer Capacitance - 47 - f = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
ls Continuous Source Current MOSFET symbol 7,.,._»‘3
. - - 0.49 . A cr,
(Body Diode) showing the . W_
A . ( , h
ISM Pulsed Source Current integral reverse m. " 1 " '
(Body Diode) OD - - 3.9 p-n junction diode. "<--' ',
Vso Diode Forward Voltage - - 1.6 V To = 25°C, Is = 0.49A, VGS = 0V (4)
trr Reverse Recovery Time - 270 600 ns To = 25°C, IF = 3.3A
Qrr Reverse RecoveryCharge - 1.4 3.0 pC di/dt = 100/Vps (4)
ton Forward Tum-On Time Intrinsic turn-on time is negligible (turn-on is dominated by L5+LD)
Notes:
co Repetitive rating; pulse width limited by (3 'sn 5 2.0A, di/dt s: 40A/ps, I/oo g V(BR)DSSv
max. junction temperature. (See fig. 11 ) Tu f 150°C
© VDD = 50V, starting To = 25°C, L = 21mH © Pulse width S 300ps; duty cycle 5 2%.
Rs = 259, IAS = 2.0A. (See Figure 12)
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