HCF4082BM1 ,4 INPUT AND GATEAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4093 ,QUAD 2-INPUT NAND SCHMIDT TRIGGERSAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4093BEY ,QUAD 2-INPUT NAND SCHMIDT TRIGGERSAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
HCF4093BM1 ,QUAD 2-INPUT NAND SCHMIDT TRIGGERSABSOLUTE MAXIMUM RATINGS Symbol Parameter Value UnitV Supply Voltage-0.5 to +22 VDDV DC Input ..
HCF4093M013TR ,QUAD 2-INPUT NAND SCHMIDT TRIGGERSHCF4093BQUAD 2 INPUT NAND SCHMITT TRIGGER ■ SCHMITT TRIGGER ACTION ON EACH INPUT WITH NO EXTERNAL ..
HCF4094 ,8-STAGE SHIFT-AND-STORE BUS REGISTERHCF4094B8 STAGE SHIFT AND STORE BUS REGISTERWITH 3-STATE OUTPUTS
HCF4082BM1
4 INPUT AND GATE
1/7September 2001 MEDIUM SPEED OPERATION :
tPD = 60ns (Typ.) at 10V QUIESCENT CURRENT SPECIFIED UP TO
20V 5V, 10V AND 15V PARAMETRIC RATINGS INPUT LEAKAGE CURRENT
II = 100nA (MAX) AT VDD = 18V TA = 25°C 100% TESTED FOR QUIESCENT CURRENT MEETS ALL REQUIREMENTS OF JEDEC
JESD13B " STANDARD SPECIFICATIONS
FOR DESCRIPTION OF B SERIES CMOS
DEVICES"
DESCRIPTIONThe HCF4082B is a monolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
The HCF4082B DUAL 4 INPUT AND GATE
provides the system designer with direct
implementation of the AND function and
supplement the existing family of CMOS gates.
HCF4082BDUAL 4 INPUT AND GATE
PIN CONNECTION
ORDER CODES
HCF4082B2/7
INPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE X : Don’t Care
ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
HCF4082B3/7
DC SPECIFICATIONS The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.
HCF4082B4/7
TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance)
RL = 200KΩ
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
