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AD5381BST-5 |AD5381BST5ADIN/a3avai40-Channel 12-Bit 3 V/5 V Single-Supply Voltage-Output DAC


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AD5381BST-5
40-Channel 12-Bit 3 V/5 V Single-Supply Voltage-Output DAC
40-Channel, 3 V/5 V, Single-Supply,
12-Bit, Voltage Output DAC

Rev. A
FEATURES
Guaranteed monotonic
INL error: ±1 LSB max
On-chip 1.25 V/2.5 V, 10 ppm/°C reference
Temperature range: –40°C to +85°C
Rail-to-rail output amplifier
Power-down
Package type: 100-lead LQFP (14 mm × 14 mm)
User Interfaces:
Parallel
Serial (SPI®/QSPI™/MICROWIRE™/DSP compatible,
featuring data readback) 2C® compatible
INTEGRATED FUNCTIONS
Channel monitor
Simultaneous output update via LDAC
Clear function to user programmable code
Amplifier boost mode to optimize slew rate
User programmable offset and gain adjust
Toggle mode enables square wave generation
Thermal monitors
APPLICATIONS
Variable optical attenuators (VOA)
Level setting (ATE)
Optical micro-electro-mechanical systems (MEMs)
Control systems
Instrumentation
FUNCTIONAL BLOCK DIAGRAM
VOUT0
VOUT1
VOUT2
VOUT3
VOUT4
VOUT5
VOUT6
VOUT7
VOUT8

DB11/(DIN/SDA)
DB10/(SCLK/SCL)
DB9/(SPI/I2C)
DB8
REG 0
REG 1
RESET
BUSY
CLR
SER/PAR
FIFO EN
CS/(SYNC/AD 0)
WR/(DCEN/AD 1)
SDO
VOUT 39/MON_OUTLDAC
VOUT38
DVDD (×3)DGND (×3)AVDD (×5)AGND (×5)DAC GND (×5)REFGNDREFOUT/REFINSIGNAL GND (×5)
DB0
Figure 1.
TABLE OF CONTENTS
General Description.........................................................................3
Specifications.....................................................................................4
AD5381-5 Specifications.............................................................4
AD5381-3 Specifications.............................................................6
AC Characteristics........................................................................7
Timing Characteristics.....................................................................8
Serial Interface Timing................................................................8 C Serial Interface Timing2........................................................10
Parallel Interface Timing...........................................................11
Absolute Maximum Ratings..........................................................13
Pin Configuration and Function Descriptions...........................14
Terminology....................................................................................17
Typical Performance Characteristics...........................................18
Functional Description..................................................................21
DAC Architecture—General.....................................................21
On-Chip Special Function Registers (SFR)............................22
SFR Commands..........................................................................22
Hardware Functions.......................................................................25
Reset Function............................................................................25
Asynchronous Clear Function..................................................25
BUSY and LDAC Functions......................................................25
FIFO Operation in Parallel Mode............................................25
Power-On Reset..........................................................................25
Power-Down...............................................................................25
AD5381 Interfaces..........................................................................26
DSP, SPI, MICROWIRE Compatible Serial Interfaces..........26 C Serial Interface2.....................................................................28
Parallel Interface.........................................................................30
Microprocessor Interfacing.......................................................31
Application Information................................................................33
Power Supply Decoupling.........................................................33
Typical Configuration Circuit..................................................33
AD5381 Monitor Function.......................................................34
Toggle Mode Function...............................................................34
Thermal Monitor Function.......................................................34
Optical Attenuators....................................................................35
Utilizing the AD5381 FIFO.......................................................35
Outline Dimensions.......................................................................36
Ordering Guide..........................................................................36
REVISION HISTORY
6/04—Data Sheet Changed from Rev. 0 to Rev. A

Changes to Ordering Guide...........................................................36
5/04—Revision 0: Initial Version
GENERAL DESCRIPTION
The AD5381 is a complete, single-supply, 40-channel, 12-bit
DAC available in a 100-lead LQFP package. All 40 channels
have an on-chip output amplifier with rail-to-rail operation.
The AD5381 includes a programmable internal 1.25 V/2.5 V,
10 ppm/°C reference, an on-chip channel monitor function that
multiplexes the analog outputs to a common MON_OUT pin
for external monitoring, and an output amplifier boost mode
that allows optimization of the amplifier slew rate. The AD5381
contains a double-buffered parallel interface that features a
20 ns WR pulse width, an SPI/QSPI/MICROWIRE/DSP
compatible serial interface with interface speeds in excess of
30 MHz, and an I2C compatible interface that supports a
400 kHz data transfer rate.
An input register followed by a DAC register provides double
buffering, allowing the DAC outputs to be updated indepen-
dently or simultaneously using the LDAC input.
Each channel has a programmable gain and offset adjust
register that allows the user to fully calibrate any DAC channel.
Power consumption is typically 0.25 mA/channel with boost
mode disabled.
Table 1. Other Low Voltage Single-Supply DACs in Product Family

Table 2. 40-Channel, Bipolar Voltage Output DAC

SPECIFICATIONS
AD5381-5 SPECIFICATIONS
Table 3. AVDD = 4.5 V to 5.5 V; DVDD = 2.7 V to 5.5 V, AGND = DGND = 0 V; External REFIN = 2.5 V;
all specifications TMIN to TMAX, unless otherwise noted

1 AD5381-5 is calibrated using an external 2.5 V reference. Temperature range for all versions: –40°C to +85°C. Accuracy guaranteed from VOUT = 10 mV to AVDD – 50 mV.
3 Guaranteed by characterization, not production tested. Default on the AD5381-5 is 2.5 V. Programmable to 1.25 V via CR10 in the AD5381 control register; operating the AD5381-5 with a 1.25 V reference will lead to
degraded accuracy specifications.
AD5381-3 SPECIFICATIONS
Table 4. AVDD = 2.7 V to 3.6 V; DVDD = 2.7 V to 5.5 V, AGND = DGND = 0 V; External REFIN = 1.25 V;
all specifications TMIN to TMAX, unless otherwise noted

AD5381-3 is calibrated using an external 1.25 V reference. Temperature range is –40°C to +85°C.
2 Accuracy guaranteed from VOUT = 10 mV to AVDD – 50 mV. Guaranteed by characterization, not production tested.
4 Default on the AD5381-3 is 1.25 V. Programmable to 2.5 V via cr10 in the AD5381 control register; operating the AD5381-3 with a 2.5 V reference will lead to degraded
accuracy specifications and limited input code range.
AC CHARACTERISTICS1
Table 5. AVDD = 4.5 V to 5.5 V; DVDD = 2.7 V to 5.5 V; AGND = DGND = 0 V

Guaranteed by design and characterization, not production tested.
2 Slew rate can be programmed via the current boost control bit in the AD5381 control register.
TIMING CHARACTERISTICS
SERIAL INTERFACE TIMING
Table 6. DVDD= 2.7 V to 5.5 V; AVDD = 4.5 V to 5.5 V or 2.7 V to 3.6 V; AGND = DGND = 0 V; all specifications
TMIN to TMAX, unless otherwise noted

Guaranteed by design and characterization, not production tested.
2 All input signals are specified with tr = tf = 5 ns (10% to 90% of VCC) and are timed from a voltage level of 1.2 V. See Figur, , and . Figure 2,e 3Figure 4Figure 5 Standalone mode only. Daisy-chain mode only.
50pFVOH (MIN) OR
VOL (MAX)
200µA
200µA
IOL
IOH

03731-0-003
Figure 2. Load Circuit for Digital Output Timing
1LDAC ACTIVE DURING BUSY
2LDAC ACTIVE AFTER BUSY
BUSY
SYNC
LDAC1
LDAC2
CLR
VOUT
VOUT2
VOUT1
DIN
SCLK

Figure 3. Serial Interface Timing Diagram (Standalone Mode)
t7ASCLK
SYNC
DIN
SDO
INPUT WORD SPECIFIES
REGISTER TO BE READ
UNDEFINED
NOP CONDITION
SELECTED REGISTER
DATA CLOCKED OUT

03731-0-005
Figure 4. Serial Interface Timing Diagram (Data Readback Mode)
t13
SCLK
SYNC
SDO
DIN
LDAC

03731-0-006
2C SERIAL INTERFACE TIMING Table 7. DVDD = 2.7 V to 5.5 V; AVDD = 4.5 V to 5.5 V or 2.7 V to 3.6 V; AGND = DGND = 0 V; all specifications
TMIN to TMAX, unless otherwise noted


1 Guaranteed by design and characterization, not production tested. See Figure 6.
3 A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the VIH min of the SCL signal) in order to bridge the undefined region of
SCL’s falling edge.
4 Cb is the total capacitance, in pF, of one bus line. tR and tF are measured between 0.3DVDD and 0.7DVDD.
START
CONDITION
REPEATED
START
CONDITION
STOP
CONDITIONt7

03731-0-007
Figure 6. I2C Compatible Serial Interface Timing Diagram
PARALLEL INTERFACE TIMING
Table 8. DVDD = 2.7 V to 5.5 V; AVDD = 4.5 V to 5.5 V or 2.7 V to 3.6 V; AGND = DGND = 0 V; all specifications
TMIN to TMAX, unless otherwise noted


1 Guaranteed by design and characterization, not production tested. All input signals are specified with tR = tR = 5 ns (10% to 90% of DVDD) and timed from a voltage level of 1.2 V.
3 See . Figure 7 See . Figure 29
5 Measured with the load circuit of . Figure 2
REG0, REG1, A5..A0
DB11..DB0
BUSY
LDAC1
VOUT1
VOUT2
CLR
VOUT
LDAC2
2LDAC ACTIVE AFTER BUSY

03731-0-008
Figure 7. Parallel Interface Timing Diagram
ABSOLUTE MAXIMUM RATINGS
Table 9. TA = 25°C, unless otherwise noted1

Transient currents of up to 100 mA will not cause SCR latch-up
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
this product features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
IGNAL_
ND5
DAC_
GND5
AGND5AV
DD5
VOU
VOU
VOU
VOU
VOU
VOU
VOU
VOU
VOU
VOU
UT3
/MON_
OUT
VOU
VOU
VOU
VOU
VOU
DAC_
GND2
IGNAL_
ND2
VOU
VOU
VOU
NC/AD0
DA)
CLK/S
N/AD1
FIFO EN
CLR
VOUT24
VOUT25
VOUT26
VOUT27
SIGNAL_GND4
DAC_GND4
AGND4
AVDD4
VOUT28
VOUT29
VOUT30
VOUT31
REF GND
REFOUT/REFIN
SIGNAL_GND1
DAC_GND1
AVDD1
VOUT0
VOUT1
VOUT2
VOUT3
VOUT4
AGND1

03732-0-002
Figure 8. 100-Lead LQFP Pin Configuration
Table 10. Pin Function Descriptions


TERMINOLOGY
Relative Accuracy

Relative accuracy or endpoint linearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero-scale error and full-scale error, and is
expressed in LSB.
Differential Nonlinearity

Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
Zero-Scale Error

Zero-scale error is the error in the DAC output voltage when all
0s are loaded into the DAC register. Ideally, with all 0s loaded to
the DAC and m = all 1s, c = 2n – 1
VOUT(Zero-Scale) = 0 V
Zero-scale error is a measure of the difference between VOUT
(actual) and VOUT (ideal), expressed in mV. It is mainly due to
offsets in the output amplifier.
Offset Error

Offset error is a measure of the difference between VOUT
(actual) and VOUT (ideal) in the linear region of the transfer
function, expressed in mV. Offset error is measured on the
AD5381-5 with Code 32 loaded into the DAC register, and on
the AD5381-3 with Code 64.
Gain Error

Gain Error is specified in the linear region of the output range
between VOUT = 10 mV and VOUT = AVDD – 50 mV. It is the
deviation in slope of the DAC transfer characteristic from the
ideal and is expressed in %FSR with the DAC output unloaded.
DC Crosstalk

This is the dc change in the output level of one DAC at midscale
in response to a full-scale code (all 0s to all 1s, and vice versa)
and output change of all other DACs. It is expressed in LSB.
DC Output Impedance

This is the effective output source resistance. It is dominated by
package lead resistance.
Output Voltage Settling Time

This is the amount of time it takes for the output of a DAC to
settle to a specified level for a ¼ to ¾ full-scale input change,
and is measured from the BUSY rising edge.
Digital-to-Analog Glitch Energy

This is the amount of energy injected into the analog output at
the major code transition. It is specified as the area of the glitch
in nV-s. It is measured by toggling the DAC register data
between 0x7FF and 0x800.
DAC-to-DAC Crosstalk

DAC-to-DAC crosstalk is the glitch impulse that appears at the
output of one DAC due to both the digital change and to the
subsequent analog output change at another DAC. The victim
channel is loaded with midscale. DAC-to-DAC crosstalk is
specified in nV-s.
Digital Crosstalk

The glitch impulse transferred to the output of one converter
due to a change in the DAC register code of another converter
is defined as the digital crosstalk and is specified in nV-s.
Digital Feedthrough

When the device is not selected, high frequency logic activity on
the device’s digital inputs can be capacitively coupled both
across and through the device to show up as noise on the
VOUT pins. It can also be coupled along the supply and ground
lines. This noise is digital feedthrough.
Output Noise Spectral Density

This is a measure of internally generated random noise.
Random noise is characterized as a spectral density (voltage per
√Hertz). It is measured by loading all DACs to midscale and
measuring noise at the output. It is measured in nV/√Hz in a
1 Hz bandwidth at 10 kHz.
TYPICAL PERFORMANCE CHARACTERISTICS
03732-0-017INPUT CODE
INL E
RROR (LS
–1.00

Figure 9. Typical AD5381-5 INL Plot
03731-0-034SAMPLE NUMBER
AMP
ITUDE
(V
2.524

Figure 10. AD5381-5 Glitch Impulse
Figure 11. Slew Rate with Boost Off
03732-0-018INPUT CODE
INL E
RROR (LS
–1.00

Figure 12. Typical AD5381-3 INL Plot
03731-0-036SAMPLE NUMBER
AMP
ITUDE
(V
1.246

Figure 13. AD5381-3 Glitch Impulse
Figure 14. Slew Rate with Boost On
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