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74LVX08MSTN/a561avaiLOW VOLTAGE CMOS QUAD 2-INPUT AND GATE
74LVX08TTRSTN/a5000avaiLOW VOLTAGE CMOS QUAD 2-INPUT AND GATE
74LVX08TTRSTMN/a10000avaiLOW VOLTAGE CMOS QUAD 2-INPUT AND GATE
74LVX08TTRST,STN/a10000avaiLOW VOLTAGE CMOS QUAD 2-INPUT AND GATE


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74LVX08M-74LVX08TTR
LOW VOLTAGE CMOS QUAD 2-INPUT AND GATE
1/8July 2001 HIGH SPEED :
tPD = 4.8ns (TYP.) at VCC = 3.3V 5V TOLERANT INPUTS INPUT VOLTAGE LEVEL :IL =0.8V, VIH =2V AT VCC =3V LOW POWER DISSIPATION:CC = 2 μA (MAX.) at TA =25°C LOW NOISE:
VOLP = 0.3V (TYP .) at VCC = 3.3V SYMMETRICAL OUTPUT IMPEDANCE:OH | = IOL = 4mA (MIN) BALANCED PROPAGATION DELAYS:
tPLH ≅ tPHL OPERATING VOLTAGE RANGE:CC (OPR) = 2V to 3.6V (1.2V Data Retention) PIN AND FUNCTION COMPATIBLE WITH
74 SERIES 08 IMPROVED LATCH-UP IMMUNITY POWER DOWN PROTECTION ON INPUTS
DESCRIPTION

The 74LVX08 is a low voltage CMOS QUAD
2-INPUT AND GATE fabricated with sub-micron
silicon gate and double-layer metal wiring C2 MOS
technology. It is ideal for low power, battery
operated and low noise 3.3V applications.
The internal circuit is composed of 2 stages
including buffer output, which provides high noise
immunity and stable output.
Power down protection is provided on all inputs
and 0 to 7V can be accepted on inputs with no
regard to the supply voltage.
This device can be used to interface 5V to 3V
system. It combines high speed performance with
the true CMOS low power consumption. All inputs
and outputs are equipped with protection circuits
against static discharge, giving them 2KV ESD
immunity and transient excess voltage.
74LVX08

LOW VOLTAGE CMOS QUAD 2-INPUT AND GATE
WITH 5V TOLERANT INPUTS
PIN CONNECTION AND IEC LOGIC SYMBOLS
ORDER CODES
74LVX08
2/8
INPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
RECOMMENDED OPERATING CONDITIONS

1) Truth Table guaranteed: 1.2V to 3.6V
2) VIN from 0.8V to 2.0V
74LVX08
3/8
DC SPECIFICATIONS
DYNAMIC SWITCHING CHARACTERISTICS

1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (VILD), 0V to threshold
(VIHD), f=1MHz.
74LVX08
4/8
AC ELECTRICAL CHARACTERISTICS (Input t
r = tf = 3ns)
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-
ing in the same direction, either HIGH or LOW
2) Parameter guaranteed by design
(*) Voltage range is 3.3V ± 0.3V
CAPACITIVE CHARACTERISTICS

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per gate)
74LVX08
5/8
TEST CIRCUIT

CL =15/50pF or equivalent (includes jig and probe capacitance)
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM: PROPAGATION DELAYS (f=1MHz; 50% duty cycle)

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