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74AC04TOSN/a1500avaiHEX INVERTER


74AC04 ,HEX INVERTERAbsolute Maximum Ratings are those values beyond which damage to the device may occur. Functional o ..
74AC04MTC ,Hex InverterFeaturesThe AC/ACT04 contains six inverters.

74AC04
HEX INVERTER
1/8April 2001 HIGH SPEED: tPD = 4ns (TYP .) at VCC = 5V LOW POWER DISSIPATION:CC = 2μA(MAX.) at TA =25°C HIGH NOISE IMMUNITY:
VNIH = VNIL = 28 % VCC (MIN.) 50Ω TRANSMISSION LINE DRIVING
CAPABILITY SYMMETRICAL OUTPUT IMPEDANCE:OH| = IOL = 24mA (MIN) BALANCED PROPAGATION DELAYS:PLH ≅ tPHL OPERATING VOLTAGE RANGE:
VCC (OPR) = 2V to 6V PIN AND FUNCTION COMPATIBLE WITH
74 SERIES 04 IMPROVED LATCH-UP IMMUNITY
DESCRIPTION

The 74AC04 is an advanced high-speed CMOS
HEX INVERTER fabricated with sub-micron
silicon gate and double-layer metal wiring C2 MOS
tecnology.
The internal circuit is composed of 3 stages
including buffer output, which enables high noise
immunity and stable output.
All inputs and outputs are equipped with
protection circuits against static discharge, giving
them 2KV ESD immunity and transient excess
voltage.
74AC04

HEX INVERTER
PIN CONNECTION AND IEC LOGIC SYMBOLS
ORDER CODES
74AC04
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INPUT AND OUTPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
TRUTH TABLE
ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
RECOMMENDED OPERATING CONDITIONS

1) VIN from 30% to 70% of VCC
74AC04
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DC SPECIFICATIONS

1) Maximum test duration 2ms, one output loaded at time
2) Incident wave switching is guaranteed on transmission lines with impedances as low as 50Ω
AC ELECTRICAL CHARACTERISTICS (C
L = 50 pF, RL = 500 Ω, Input tr = tf = 3ns)
(*) Voltage range is 3.3V ± 0.3V
(**) Voltage range is 5.0V ± 0.5V
74AC04
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CAPACITIVE CHARACTERISTICS

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/6 (per gate)
TEST CIRCUIT

CL = 50pF or equivalent (includes jig and probe capacitance)
RL = R1 = 500Ω or equivalent
RT = ZOUT of pulse generator (typically 50Ω)
WAVEFORM: PROPAGATION DELAYS (f=1MHz; 50% duty cycle)


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