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54F153DMQBFN/a10avaiDual 4-Input Multiplexer


54F153DMQB ,Dual 4-Input MultiplexerGeneral DescriptionThe F153 is a high-speed dual 4-input multiplexer with common select inputs and ..
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54F157ADMQB ,Quad 2-Input Multiplexer
54F157ADMQB ,Quad 2-Input MultiplexerGeneral DescriptionThe F157A is a high-speed quad 2-Input multiplexer. Four bits of data from two ..
6AM14 , Silicon N-Channel/P-Channel Power MOS FET Array
6AM14 , Silicon N-Channel/P-Channel Power MOS FET Array
6B11 ,Thermocouple Inputs: mV/Volt Inputs: Current Input: Signal Conditioning ModuleGENERAL DESCRIPTION +15mV to +5V as well as 0 to +20mA process current inputs. The 6B11 and 6B11HV ..
6B12 ,Single Channel Signal Conditioning ModuleGENERAL DESCRIPTION the 6B12 and 6B12HV modules for address, input range, baud The 6B12 and 6B12HV ..
6B13 ,2-, 3-, 4-wire RTD Inputs: Signal Conditioning ModuleGENERAL DESCRIPTION RTDs) is supplied by a tracking pair of current sources. The The 6B13 and 6B13 ..
6B21 ,Isolated Current Output: Signal Conditioning ModuleGENERAL DESCRIPTION through an RS-485 port to exchange command and status The 6B21 is a single-cha ..


54F153DMQB
Dual 4-Input Multiplexer
Original Creation Date: 03/14/96
Last Update Date: 07/30/96
Last Major Revision Date: 03/14/96MN54F153-X REV 1A0
MILITARY DATA SHEET
DUAL 4-INPUT Multiplexer
General Description

The F153 is a high-speed dual 4-input multiplexer with common select inputs and individual
enable inputs for each section inputs and individual enable inputs for each section. It
can select two lines of data from four sources. The two buffered outputs present data in
the true (non-inverted) form. In addition to multiplexer operation the F153 can generate
any two functions of three variables.
NS Part Numbers

54F153DMQB
54F153FMQB
54F153LMQB
Industry Part Number

54F153
Prime Die

M153
Processing

MIL-STD-883, Method 5004
Quality Conformance Inspection

MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
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