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TPS3808G01MDBVTEP-V62/08607-01XE
Enhanced Product Low Quiescent Current, Programmable Delay Supervisory Circuit
3.3V
TPS3808G33DDSENSE
3.3V
TPS3808G33VDDSENSE
RESET
3.3V
VDD
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TPS3808-EPSBVS103D –APRIL 2008–REVISED DECEMBER 2014
TPS3808-EP Low Quiescent Current, Programmable Delay Supervisory Circuit Features 2 Applications Controlled Baseline • DSPor Microcontroller Applications Notebook/Desktop Computers– One Assembly Site PDAs and Hand-Held Products– One Test Site Portable and Battery Powered Products– One Fabrication Site FPGA and ASIC Applications• Extended Temperature Performanceof
–55°Cto 125°C
Description• Enhanced Diminishing Manufacturing Sources
The TPS3808xxx family of microprocessor(DMS) Support supervisory circuits monitors system voltages from• Enhanced Product-Change Notification 0.4Vto 5.0V, assertingan open-drain RESET signal• Qualification Pedigree(1) when the SENSE voltage drops belowa preset
thresholdor when the manual reset (MR) pin dropsto• Power-On Reset Generator With Adjustable Delay logic low. The RESET output remains low for theTime: 1.25 msto10s
user-adjustable delay time after the SENSE voltage• Very Low Quiescent Current: 2.4 μA Typical and manual reset (MR) return above the respective• High Threshold Accuracy: 0.5% Typical thresholds. Fixed Threshold Voltages for Standard Voltage The TPS3808 usesa precision referenceto achieveRails From 0.9Vto5V and Adjustable Voltage 0.5% threshold accuracy for VIT≤ 3.3V. The resetDownto 0.4V Are Available delay time can be setto 20 ms by disconnecting the Manual Reset (MR) Input CT pin, 300 msby connecting the CT pinto VDD using resistor,or can be user-adjusted between 1.25 ms• Open-Drain RESET Output and 10s by connecting the CT pinto an external• Temperature Range: –55°Cto 125°C capacitor. The TPS3808 hasa very low typical• Small SOT-23 Package quiescent currentof 2.4 μA, soitis well-suitedto
battery-powered applications.Itis availableina small
SOT-23 package, and is fully specified overa
temperature rangeof –55°Cto +125°C (TJ).(1) Component qualificationin accordance with JEDEC and
industry standardsto ensure reliable operation overan
extended temperature range. This includes,butisnot limited
Device Information(1)to, Highly Accelerated Stress Test (HAST)or biased 85/85,temperature cycle, autoclaveor unbiased HAST,electromigration, bond intermetallic life, and mold compound
life. Such qualification testing shouldnotbe viewedas (1) Forall available packages, see the orderable addendumatjustifying useof this component beyond specified the endofthe datasheet.performance and environmental limits.
Typical Application Circuit
