TC7SZ00FE ,L-MOS SHS series (TC74LCX-equivalent)Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Supply voltage V −0.5 to 6 ..
TC7SZ00FU ,2 INPUT NAND GATEELECTRICAL CHARACTERISTICS(1_'T's'jjt,i:C-'"r-C/oC/lis,s:r"-C""t,High-Level Input x VCC x VCCVoltag ..
TC7SZ02AFE ,2 Input NOR GateElectrical Characteristics DC Characteristics Ta 25°C Ta 40~85°CTest Characteristics Symbol T ..
TC7SZ02F ,2 INPUT NOR GATETC7S202F/FU_tqF.-9.m-q '2 INPUT NOR GATE
TC7SZ02FU ,2 INPUT NOR GATEELECTRICAL CHARACTERISTICSTa = 25°C a = -40--850Ctjf Ta--2socCHARACTERISTIC SYMBOL TEST CONDITION t ..
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TC7SZ00FE
L-MOS SHS series (TC74LCX-equivalent)
TC7SZ00FE TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7SZ00FE 2-Input NAND Gate
Features High output current : ±24 mA (min) at VCC = 3 V Super high speed operation : tpd = 2.4 ns (typ.)
at VCC = 5 V, 50pF Operating voltage range : VCC = 1.65 to 5.5 V 5.5-V tolerant inputs 5.5-V power down protection output Matches the performance of TC74LCX series when operated at
3.3-V VCC
Marking Pin Assignment (top view)
Absolute Maximum Ratings (Ta = 25°C) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: VCC = 0V
Note 2: High or Low state. Do not exceed IOUT of absolute maximum ratings.
Weight: 0.003 g (typ.)
Product Name
5 VCC
OUT Y
IN A
2GND
3IN B
1
