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TA8749S
4 fsc CLOCK GENERATOR
TOSH I BA TA8749S
TOSHIBA BIPOLAR LINEAR INTEGRATED CIRCUIT SILICON MONOLITHIC
TA87495
4 fsc CLOCK GENERATOR
The TA8749S provides the function for CCD clock driver,
and generate 4 times frequency signal of the input fsc
signal by PLL Circuit.
FEATURES
0 4 fsc VCO
0 Phase comparator
SIP7-P-2.54A
Weight : 0.72g (Typ.)
BLOCK DIAGRAM
PLL Input
PLL Filter
Adjustment
1 2001-06-25
TOSH I BA TA8749S
MAXIMUM RATINGS (Ta = 25°C)
CHARACTERISTIC SYMBOL RATING UNIT
Supply Voltage VCC 15 V
Input Signal Level ein 5 Vp-p
Power Dissipation PD (Note) 400 mW
Operating Temperature Topr - 20--65 "C
Storage Temperature Tstg - 55~150 "C
(Note) When using the device at above Ta =25°C, decrease the power dissipation by 4mW
for each increase of 1°C.
ELECTRICAL CHARACTERISTICS
DC characteristics (Unless otherwise specified, Vcc=9V, Ta =25°C)
PIN No. PIN NAME SYMBOL CIR- TEST CONDITION MIN. TYP. MAX. UNIT
1 PLL Input V1 - - 4.2 4.5 4.8 V
2 PLL Filter V2 - - 3.1 3.6 4.1 V
3 VCO Adjustment V3 - - 4.4 4.6 4.8 V
4 GND - - - - 0 - V
5 VCO c - - - - - - v
6 4 fsc Output V6 - - - 6.5 - V
7 VCC - - - - 9 - V
7 VCC ly - - 9 11 15 mA
AC characteristics (Unless otherwise specified, Vcc=9V, Ta =25°C)
CHARACTERISTIC SYMBOL CIR- TEST CONDITION MIN. TYP. MAX. UNIT
4f L I Pin6 V5 (N t 1) 1.0 1.5 2.0 V
sc eve Pin 5 v5 - o e 0.4 0.5 0.6 p-p
VCO Variable High fch 15.3 18.0 -
Range Low fd - (Note 2) - 11.0 13.3 MHz
Input Sensitivity Vi - (Note 3) - - 0.1 Vp-p
PLL PuII-in High fph 3.78 3.90 -
Range Low fy - (Note 4) - 3.20 3.38 MHz
fsc Leak Level fs - (Note 5) 50 60 - dB
2 2001-06-25
TOSH I BA TA8749S
TEST CONDITION
MEASUREMENT CONDITION (VCC = 9.0V, Ta = 25°C)
No. SW & VR MODE MEASUREMENT METHOD
Pin 6 - (1) No signal input
1 4 fsc Level (2) Measure amplitude of 4 fsc at pin 6 and pin
Pin 5 - S.
. (1) No signal input
. High - (2) Measure the frequency of output signal at
2 VCO Variable pin 6.
Range Low - (3) Measure the frequency at each mode. co Pin
2=7.5V © Pin2=1.5V
(1)V6 input : fo=3.58MHz level variable
(2) Monitor pin 6 output wave form. Change
the input level higher, and get the level to
pull-in.
3 Input Sensitivity -
Hi h (1)1/6 input : f=sweep, 300mVp-p CW
ll . lg - (2) Change the input frequency C)-ohigh
4 PLL Pu -ln Range (2)-aLow, and get the frequency to puII-in
LOW - by sweeping.
(1)V6 input : fo=3.58MHz, 300mVp-p CW
5 fsc Leak Level - (2) Monitor pin 6 output, and calculate
14.32MHz/3.58MHZ.
TEST CIRCUIT
Vcc 9V
T A 8 7 4 9 S
PLL VCO 4fsc
PLL Input Filter Adjustment GND VCO C Output VCO
(f, 2 2 t 5 6 Q)
T, t N C
u G J? 8 m f) m u. U) LL
o m R33 "fe sjii SI;
v6 Am .
1 30kQ l
3 2001-06-25
TOSH I BA TA8749S
PACKAGE DIMENSIONS
S|P7-P-2.54A Unit : mm
l l " I tr?
I I g fd
+l ru. .,
oz 'tro -
V l +0.1
0.98TYP _ 0.5i0.1 [1250.25» 0.251h".hs
1.2:e0.1
L. 17.7MAX 'p',
= 17.2w2 ‘
Weight : 0.72g (Typ.)
4 2001-06-25
TOSH I BA TA8749S
RESTRICTIONS ON PRODUCT USE
000707EBA
OTOSHIBA is continually working to improve the quality and reliability of its products.
Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent
electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer,
when utilizing TOSHIBA products, to comply with the standards of safety in making a safe
design for the entire system, and to avoid situations in which a malfunction or failure of such
TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified
operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please
keep in mind the precautions and conditions set forth in the "Handling Guide for
Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc..
OThe TOSHIBA products listed in this document are intended for usage in general electronics
applications (computer, personal equipment, office equipment, measuring equipment, industrial
robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor
warranted for usage in equipment that requires extraordinarily high quality and/or reliability or
a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended
Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship
instruments, transportation instruments, traffic signal instruments, combustion control
instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA
products listed in this document shall be made at the customer's own risk.
0 The products described in this document are subject to the foreign exchange and foreign trade
OThe information contained herein is presented only as a guide for the applications of our
products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of
intellectual property or other rights of the third parties which may result from its use. No
license is granted by implication or otherwise under any intellectual property or other rights of
TOSHIBA CORPORATION or others.
0 The information contained herein is subject to change without notice.
5 2001-06-25
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