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STD50NH02LSTN/a25200avaiN-CHANNEL 24V


STD50NH02L ,N-CHANNEL 24VABSOLUTE MAXIMUM RATINGSSymbol Parameter Value UnitV Drain-source Voltage Rating 30 Vspike(1)V Drai ..
STD50NH02L-1 ,N-CHANNEL 24VELECTRICAL CHARACTERISTICS (T = 25 °C UNLESS OTHERWISE SPECIFIED)CASEOFFSymbol Parameter Test Condi ..
STD50NH02L-1 ,N-CHANNEL 24VSTD50NH02LN-CHANNEL 24V - 0.0085 Ω - 50A DPAK/IPAKSTripFET™ III POWER MOSFETTYPE V R IDSS DS(on) DS ..
STD50NH02LT4 ,N-CHANNEL 24VABSOLUTE MAXIMUM RATINGSSymbol Parameter Value UnitVDrain-source Voltage Rating 30 Vspike(1)V Drain ..
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SUB60N06-18 ,N-Channel Enhancement-Mode Trans  FaxBack 408-970-5600S–57253—Rev. D, 24-Feb-982-1SUP/SUB60N06-18Vishay Siliconix 

STD50NH02L
N-CHANNEL 24V
1/10
PRELIMINARY DATA

February 2003
STD50NH02L

N-CHANNEL 24V - 0.0085 Ω - 50A DPAK/IPAK
STripFET™ III POWER MOSFET TYPICAL RDS(on) = 0.0085 Ω @ 10 V TYPICAL RDS(on) = 0.012 Ω @ 5 V RDS(ON) * Qg INDUSTRY’s BENCHMARK CONDUCTION LOSSES REDUCED SWITCHING LOSSES REDUCED LOW THRESHOLD DEVICE THROUGH-HOLE IPAK (TO-251) POWER
PACKAGE IN TUBE (SUFFIX “-1") SURFACE-MOUNTING DPAK (TO-252)
POWER PACKAGE IN TAPE & REEL
(SUFFIX “T4")
DESCRIPTION

The STD50NH02L utilizes the latest advanced design
rules of ST’s proprietary STripFET™ technology. This is
suitable fot the most demanding DC-DC converter
application where high efficiency is to be achieved.
APPLICATIONS
SPECIFICALLY DESIGNED AND OPTIMISED
FOR HIGH EFFICIENCY DC/DC CONVERTES
ABSOLUTE MAXIMUM RATINGS
INTERNAL SCHEMATIC DIAGRAM
STD50NH02L
THERMAL DATA
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)

OFF
ON (4)
DYNAMIC
3/10
STD50NH02L
SWITCHING ON
SWITCHING OFF
SOURCE DRAIN DIODE

(1) Garanted when external Rg=4.7 Ω and tf < tfmax. (4) Pulsed: Pulse duration = 300 μs, duty cycle 1.5 %.
(2) Pulse width limited by safe operating area (5) Qoss = Coss*Δ Vin , Coss = Cgd + Cds . See Appendix A
(3) Starting Tj = 25 oC, ID = 25A, VDD = 15V
.
ELECTRICAL CHARACTERISTICS (continued)
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 4: Gate Charge test Circuit

And Diode Recovery Times


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