SSM6L36FE ,Small-signal MOSFET 2 in 1Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max UnitV I = ..
SSM6L39TU ,Small-signal MOSFET 2 in 1Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Conditions Min Typ. MaxUnitV I = ..
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SSM6N04FU ,Field Effect Transistor Silicon N Channel MOS Type High Speed Switch ApplicationsApplications Unit: mm With built-in gate-source resistor: R = 1 MΩ (typ.) GS 2.5 V gate driv ..
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STB85NF3LL-1 ,N-CHANNEL 30V 0.006 OHM 85A TO-220/I2PAK LOW GATE CHARGE STRIPFET MOSFETELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)OFFSymbol Parameter Test Condi ..
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STB85NF3LL-T4 ,N-CHANNEL 30V 0.006 OHM 85A D2PAK LOW GATE CHARGE STRIPFET POWER MOSFETSTB85NF3LL2N-CHANNEL 30V - 0.006Ω - 85A D PAKLOW GATE CHARGE STripFET™II POWER MOSFETTYPE V R IDSS ..
STB85NF55T4 ,N-CHANNEL 55VELECTRICAL CHARACTERISTICS (T = 25 °C unless otherwise specified)caseOFFSymbol Parameter Test Condi ..
STB8NA50 ,OLD PRODUCT: NOT SUITABLE FOR NEW DESIGN-INSTB8NA50N - CHANNEL ENHANCEMENT MODEFAST POWER MOS TRANSISTORTYPE V R IDSS DS(on) DSTB8NA50 500 V < ..
STB8NC70Z-1 ,N-CHANNEL 700V 0.90 OHM 6.8A TO-220/TO-220FP/I2PAK ZENER-PROTECTED POWERMESH III MOSFETELECTRICAL CHARACTERISTICS (CONTINUED)SWITCHING ONSymbol Parameter Test Conditions Min. Typ. Max. U ..
SSM6L36FE
Small-signal MOSFET 2 in 1
SSM6L36FE TOSHIBA Field-Effect Transistor Silicon N / P Channel MOS Type
SSM6L36FE High-Speed Switching Applications
• 1.5-V drive Low ON-resistance Q1 Nch: Ron = 1.52Ω (max) (@VGS = 1.5 V)
Ron = 1.14Ω (max) (@VGS = 1.8 V)
Ron = 0.85Ω (max) (@VGS = 2.5 V)
Ron = 0.66Ω (max) (@VGS = 4.5 V)
Ron = 0.63Ω (max) (@VGS = 5.0 V)
• Q2 Pch: Ron = 3.60Ω (max) (@VGS = -1.5 V)
Ron = 2.70Ω (max) (@VGS = -1.8 V)
Ron = 1.60Ω (max) (@VGS = -2.8 V)
Ron = 1.31Ω (max) (@VGS = -4.5 V)
Q1 Absolute Maximum Ratings (Ta = 25°C) mA
Q2 Absolute Maximum Ratings (Ta = 25°C) mA
Absolute Maximum Ratings (Ta = 25 °C) (Common to the Q1, Q2) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: Total rating
Mounted on an FR4 board 2
Unit: mm
Weight: 3.0 mg (typ.)
