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SSM6K211FETOSHIBAN/a48000avaiSmall-signal MOSFET


SSM6K211FE ,Small-signal MOSFETAbsolute Maximum Ratings (Ta = 25˚C) Characteristic Symbol Rating Unit Drain-source voltage V 20 V ..
SSM6K22FE ,Small-signal MOSFETabsolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semi ..
SSM6K24FE ,Small-signal MOSFETElectrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. MaxUnitGate l ..
SSM6K25FE ,Small-signal MOSFETElectrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max UnitGate ..
SSM6K34TU , High Current Switching Applications
SSM6K403TU ,Small-signal MOSFETAbsolute Maximum Ratings (Ta = 25˚C) (Note) 1,2,5,6 : Drain Characteristic Symbol Rating Unit 3 : ..
STB80NF10T4 ,N-CHANNEL 100VELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)OFFSymbol Parameter Test Condi ..
STB80NF10T4 ,N-CHANNEL 100VAPPLICATIONS■ HIGH-EFFICIENCY DC-DC CONVERTERS■ UPS AND MOTOR CONTROL
STB80NF10T4 ,N-CHANNEL 100VSTB80NF10N-CHANNEL 100V - 0.012Ω - 80A D2PAKLOW GATE CHARGE STripFET™ POWER MOSFETTYPE V R IDSS DS( ..
STB80NF55-06 ,N-CHANNEL 55VSTB80NF55-06STP80NF55-06 STP80NF55-06FP2N-CHANNEL 55V - 0.005 Ω - 80A TO-220/TO-220FP/D PAKSTripFET ..
STB80NF55-06T4 ,N-CHANNEL 55VSTB80NF55-06 STB80NF55-06-1STP80NF55-06 STP80NF55-06FP²N-CHANNEL 55V - 0.005 Ω - 80A TO-220/TO-220F ..
STB80NF55-06T4 ,N-CHANNEL 55VABSOLUTE MAXIMUM RATINGSSymbol Parameter Value UnitSTB80NF55-06/-1 STP80NF55-06FPSTP80NF55-06V Drai ..


SSM6K211FE
Small-signal MOSFET
SSM6K211FE
TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type (U-MOSⅢ)
SSM6K211FE
High-Speed Switching Applications Power Management Switch Applications
• 1.5-V drive
• Low ON-resistance: Ron = 118 mΩ (max) (@VGS = 1.5 V)
Ron = 82 mΩ (max) (@VGS = 1.8 V)
Ron = 59 mΩ (max) (@VGS = 2.5 V)
Ron = 47 mΩ (max) (@VGS = 4.5 V)
Absolute Maximum Ratings (Ta = 25˚C)

Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute
maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: Mounted on an FR4 board (25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 645 mm2)
Marking Equivalent Circuit (top view)

Unit: mm
Weight: 3 mg (typ.)
1 2 3 4
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