SN74BCT374DW ,Octal D-Type Edge-Triggered Flip-Flopsmaximum ratings over operating free-air temperature range (unless otherwise noted)Supply voltage ra ..
SN74BCT374N ,Octal D-Type Edge-Triggered Flip-Flops/sc/package.Please be aware that an important notice concerning availability, standard warranty, an ..
SN74BCT374N ,Octal D-Type Edge-Triggered Flip-Flops SN54BCT374, SN74BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHESWITH 3-STATE OUTPUTSSCBS019C – SEPTEMBER ..
SN74BCT374NSR ,Octal D-Type Edge-Triggered Flip-Flopsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74BCT534 ,Octal D-Type Edge-Triggered Flip-Flops 20-SOIC 0 to 70
SN74BCT540A ,Octal Buffers And Line Drivers SN54BCT540, SN74BCT540A OCTAL BUFFERS/DRIVERSWITH 3-STATE OUTPUTSSCBS012E – JULY 1988 – REVISED MA ..
SN74LVTH18502A ,3.3-V ABT Scan Test Devices With 18-Bit Universal Bus TransceiversSN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A3.3-V ABT SCAN TEST DEVICESWITH 18- ..
SN74LVTH18502APM ,3.3-V ABT Scan Test Devices With 18-Bit Universal Bus TransceiversSN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A3.3-V ABT SCAN TEST DEVICESWITH 18- ..
SN74LVTH18502APMR ,3.3-V ABT Scan Test Devices With 18-Bit Universal Bus TransceiversSN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A3.3-V ABT SCAN TEST DEVICESWITH 18- ..
SN74LVTH18504A ,3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICESWITH 2 ..
SN74LVTH18504APM ,3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICESWITH 2 ..
SN74LVTH18504APMR ,3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICESWITH 2 ..
SN74BCT374DBR-SN74BCT374DW-SN74BCT374N-SN74BCT374NSR
Octal D-Type Edge-Triggered Flip-Flops
Buffered Control Inputsdescription/ordering informationThese 8-bit flip-flops feature 3-state outputs designed specifically for driving highly capacitive or relatively
low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional
bus drivers, and working registers.
The eight flip-flops of the ’BCT374 devices are edge-triggered D-type flip-flops. On the positive transition of the
clock (CLK) input, the Q outputs are set to the logic levels that were set up at the data (D) inputs.
A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high
or low) or a high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines
significantly. The high-impedance state and the increased drive provide the capability to drive bus lines without
need for interface or pullup components. The output-enable (OE) input does not affect internal operations of
the flip-flop. Old data can be retained or new data can be entered while the outputs are in the high-impedance
state.
ORDERING INFORMATION†Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
