SN74ABT8543DL ,Scan Test Devices With Octal Registered Bus TransceiversSN54ABT8543, SN74ABT8543 SCAN TEST DEVICES WITHOCTAL REGISTERED BUS TRANSCEIVERSSCBS120E – AUGUST 1 ..
SN74ABT861NT , 10-BIT TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74ABT863DWR ,9-Bit Bus Transceivers With 3-State OutputsSN54ABT863, SN74ABT863 9-BIT BUS TRANSCEIVERSWITH 3-STATE OUTPUTSSCBS201E – FEBRUARY 1991 – REVISED ..
SN74ABT863NT , 9-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74ABT8646DW ,Scan Test Devices With Octal Bus Transceivers And Registers SCBS123F − AUGUST 1992 − ..
SN74ABT8996 ,10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers SN54ABT8996, SN74ABT8996 10-BIT ADDRESSABLE SCAN PORTSMULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) ..
SN74LS161ADR2 , BCD DECADE COUNTERS/ 4-BIT BINARY COUNTERSSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AML1 , BCD DECADE COUNTERS/ 4-BIT BINARY COUNTERSSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AMR1 , BCD DECADE COUNTERS/ 4-BIT BINARY COUNTERSSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AMR1 , BCD DECADE COUNTERS/ 4-BIT BINARY COUNTERSSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AN ,BCD decade counter/4-bit binary counterSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AN.. ,BCD decade counter/4-bit binary counterSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74ABT8543DL
Scan Test Devices With Octal Registered Bus Transceivers
Functionally Equivalent to ’F543 and’ABT543 in the Normal-Function Mode SCOPE Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes Two Boundary-Scan Cells Per I/O for
Greater Flexibility State-of-the-Art EPIC-II B BiCMOS Design
Significantly Reduces Power Dissipation Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic
DIPs (JT)
descriptionThe ’ABT8543 scan test devices with octal
registered bus transceivers are members of the
Texas Instruments SCOPE testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F543 and ’ABT543 octal registered bus
transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at
the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not
affect the functional operation of the SCOPE octal registered bus transceivers.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
CEAB
OEAB
GND
TDO
TMS
CEBA
OEBACC
TDI
TCK
TDI
TCK
TMS
TDO
OEBA
CEBA
LEBA
LEAB
CEAB
OEAB
GNDA5A6A7B2B3B4B5B6
SN54ABT8543... FK PACKAGE
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