SN74ABT8245DW ,Scan Test Devices With Octal Bus Transceivers SN54ABT8245, SN74ABT8245 SCAN TEST DEVICESWITH OCTAL BUS TRANSCEIVERSSCBS124D – AUGUST 1992 – REVI ..
SN74ABT827DB , 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN74ABT827DBR ,10-Bit Buffers/Drivers With 3-State Outputsmaximum ratings over operating free-air temperature range (unless otherwise noted)Supply voltage ra ..
SN74ABT827DW ,10-Bit Buffers/Drivers With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74ABT827DWR ,10-Bit Buffers/Drivers With 3-State Outputs SCBS159E − JANUARY 1991 − REVISED APRIL ..
SN74ABT827NSR , 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN74LS158NSR ,Quadruple 2-Line To 1-Line Data Selectors/Multiplexers
SN74LS158NSR ,Quadruple 2-Line To 1-Line Data Selectors/Multiplexers
SN74LS15N ,TRIPLE 3-INPUT AND GATE
SN74LS15N ,TRIPLE 3-INPUT AND GATE
SN74LS15N ,TRIPLE 3-INPUT AND GATE
SN74LS15N ,TRIPLE 3-INPUT AND GATE
SN74ABT8245-SN74ABT8245DW
Scan Test Devices With Octal Bus Transceivers
Functionally Equivalent to ’F245 and’ABT245 in the Normal-Function Mode SCOPE Instruction Set:
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes Two Boundary-Scan Cells per I/O for
Greater Flexibility State-of-the-Art EPIC-II B BiCMOS Design
Significantly Reduces Power Dissipation Package Options Include Plastic
Small-Outline Packages (DW), Ceramic
Chip Carriers(FK), and Standard Ceramic
DIPs (JT)
descriptionThe ’ABT8245 scan test devices with octal bus
transceivers are members of the Texas Instru-
ments SCOPE testability integrated-circuit
family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F245 and ’ABT245 octal bus transceivers.
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the
functional operation of the SCOPE octal bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The
output-enable (OE) input can be used to disable the device so that the buses are effectively isolated.
TDI
TCK
TMS
TDO
DIR
GNDB6B7A4A5NCA6A7
SN54ABT8245... FK PACKAGE
(TOP VIEW)GND
TDO
TMS
VCC
TDI
TCK
NC – No internal connection
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
