SN74ABT18646 ,Scan Test Devices With 18-Bit Bus Transceivers And Registers SN74ABT18646 SCAN TEST DEVICEWITH 18-BIT TRANSCEIVER AND REGISTERSCBS131A – AUGUST 1992 – REVISED ..
SN74ABT2240A ,Octal Buffers And Line/MOS Drivers With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74ABT2240ADB , OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS
SN74ABT2240ADW ,Octal Buffers And Line/MOS Drivers With 3-State Outputs SN54ABT2240A, SN74ABT2240A OCTAL BUFFERS AND LINE/MOS DRIVERSWITH 3-STATE OUTPUTSSCBS232E – JANUAR ..
SN74ABT2240ADWR ,Octal Buffers And Line/MOS Drivers With 3-State Outputslogic diagram (positive logic)1 191OE 2OE218 11 91A1 1Y1 2A1 2Y1416 13 71A2 1Y2 2A2 2Y2614 15 51Y3 ..
SN74ABT2240AN ,Octal Buffers And Line/MOS Drivers With 3-State Outputsmaximum ratings over operating free-air temperature range (unless otherwise noted)Supply voltage ra ..
SN74LS125ADBR ,Quadruple Bus Buffers With 3-State Outputslogic diagram (each gate)’125, ’LS125AGAY’126, ’LS126AGAYY = A2POST OFFICE BOX 655303 • DALLAS, TEX ..
SN74LS125ADBR ,Quadruple Bus Buffers With 3-State Outputsmaximum ratings over operating free-air temperature (unless otherwise noted)(’125 and ’126) Supply ..
SN74LS125ADR ,Quadruple Bus Buffers With 3-State OutputsSN54125, SN54126, SN54LS125A, SN54LS126A, SN74125, SN74126, SN74LS125A, SN74LS126AThe SN54125, SN54 ..
SN74LS125AML1 ,Quad 3-State Buffers
SN74LS125AML1 ,Quad 3-State Buffers
SN74LS125AMR1 ,Quad 3-State Buffers
SN74ABT18646
Scan Test Devices With 18-Bit Bus Transceivers And Registers
Includes D-Type Flip-Flops and ControlCircuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data Two Boundary-Scan Cells Per I/O for
Greater Flexibility
With Masking Option
– Pseudorandom Pattern Generation From
Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes1OEGND 1CLKABTDO1A21A1 1SAB V 1SBA1DIR 1B11B2TMS1CLKBA GND 1B3
2A9
GND
2SAB
2CLKAB
2A72A8
2OE
TDI
2CLKBA
2SBA
2DIR
2B9
TCK
GND
2B8
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
1B4
1B5
1B6
GND
1B7
1B8
1B9
VCC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
PM PACKAGE
(TOP VIEW)
descriptionThis scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE
testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex
circuit board assemblies. Scan access to the test circuitry is accomplished via the four-wire test access port
(TAP) interface.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
