SN74ABT18504PM ,Scan Test Devices With 20-Bit Universal Bus Transceivers SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUG ..
SN74ABT18640DL ,Scan Test Devices With 18-Bit Inverting Bus TransceiversSN54ABT18640, SN74ABT18640 SCAN TEST DEVICESWITH 18-BIT INVERTING BUS TRANSCEIVERSSCBS267C – FEBRUA ..
SN74ABT18646 ,Scan Test Devices With 18-Bit Bus Transceivers And Registers SN74ABT18646 SCAN TEST DEVICEWITH 18-BIT TRANSCEIVER AND REGISTERSCBS131A – AUGUST 1992 – REVISED ..
SN74ABT2240A ,Octal Buffers And Line/MOS Drivers With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74ABT2240ADB , OCTAL BUFFERS AND LINE/MOS DRIVERS WITH 3-STATE OUTPUTS
SN74ABT2240ADW ,Octal Buffers And Line/MOS Drivers With 3-State Outputs SN54ABT2240A, SN74ABT2240A OCTAL BUFFERS AND LINE/MOS DRIVERSWITH 3-STATE OUTPUTSSCBS232E – JANUAR ..
SN74LS125AD ,Quad 3-state buffermaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74LS125ADBR ,Quadruple Bus Buffers With 3-State Outputslogic diagram (each gate)’125, ’LS125AGAY’126, ’LS126AGAYY = A2POST OFFICE BOX 655303 • DALLAS, TEX ..
SN74LS125ADBR ,Quadruple Bus Buffers With 3-State Outputsmaximum ratings over operating free-air temperature (unless otherwise noted)(’125 and ’126) Supply ..
SN74LS125ADR ,Quadruple Bus Buffers With 3-State OutputsSN54125, SN54126, SN54LS125A, SN54LS126A, SN74125, SN74126, SN74LS125A, SN74LS126AThe SN54125, SN54 ..
SN74LS125AML1 ,Quad 3-State Buffers
SN74LS125AML1 ,Quad 3-State Buffers
SN74ABT18504-SN74ABT18504PM
Scan Test Devices With 20-Bit Universal Bus Transceivers
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture UBT (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode Two Boundary-Scan Cells per I/O for
Greater Flexibility State-of-the-Art EPIC-IIB BiCMOS Design
Significantly Reduces Power Dissipation
Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes Packaged in 64-Pin Plastic Thin Quad Flat
Pack Using 0.5-mm Center-to-Center
Spacings and 68-Pin Ceramic Quad Flat
Pack Using 25-mil Center-to-Center
SpacingsGND
B10
VCC
B11
B12
B13
B14
GND
B15
B16
B17
GND
A10
VCC
A11
A12
A13
GND
A14
A15
A16NCTMSCLKBAA3A2 A1GNDOEBALEBATDO
TCK
LEAB
OEAB
A19
GND
A20
CLKENAB
CLKAB
TDI
A17
CLKENBAB1
GND
B20B19B18
GNDB2 B4
SN54ABT18504... HV PACKAGE
(TOP VIEW)NC – No internal connection
A18
