SN74ABT18245ADLR ,Scan Test Devices With 18-Bit Bus TransceiversSN54ABT18245A, SN74ABT18245A SCAN TEST DEVICESWITH 18-BIT BUS TRANSCEIVERSSCBS110H – AUGUST 1992 – ..
SN74ABT18502 ,Scan Test Devices With 18-Bit Universal Bus Transceiver SN74ABT18502 SCAN TEST DEVICEWITH 18-BIT REGISTERED BUS TRANSCEIVERSCBS753 – FEBRUARY 2002* Member ..
SN74ABT18504 ,Scan Test Devices With 20-Bit Universal Bus Transceivers SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUG ..
SN74ABT18504PM ,Scan Test Devices With 20-Bit Universal Bus Transceivers SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUG ..
SN74ABT18640DL ,Scan Test Devices With 18-Bit Inverting Bus TransceiversSN54ABT18640, SN74ABT18640 SCAN TEST DEVICESWITH 18-BIT INVERTING BUS TRANSCEIVERSSCBS267C – FEBRUA ..
SN74ABT18646 ,Scan Test Devices With 18-Bit Bus Transceivers And Registers SN74ABT18646 SCAN TEST DEVICEWITH 18-BIT TRANSCEIVER AND REGISTERSCBS131A – AUGUST 1992 – REVISED ..
SN74LS125A ,LOW POWER SCHOTTKYmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74LS125AD ,Quad 3-state buffermaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74LS125ADBR ,Quadruple Bus Buffers With 3-State Outputslogic diagram (each gate)’125, ’LS125AGAY’126, ’LS126AGAYY = A2POST OFFICE BOX 655303 • DALLAS, TEX ..
SN74LS125ADBR ,Quadruple Bus Buffers With 3-State Outputsmaximum ratings over operating free-air temperature (unless otherwise noted)(’125 and ’126) Supply ..
SN74LS125ADR ,Quadruple Bus Buffers With 3-State OutputsSN54125, SN54126, SN54LS125A, SN54LS126A, SN74125, SN74126, SN74LS125A, SN74LS126AThe SN54125, SN54 ..
SN74LS125AML1 ,Quad 3-State Buffers
SN74ABT18245A-SN74ABT18245ADL-SN74ABT18245ADLR
Scan Test Devices With 18-Bit Bus Transceivers
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture SCOPE Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation Packaged in Plastic Shrink Small-Outline
(DL) and Thin Shrink Small-Outline (DGG)
Packages and 380-mil Fine-Pitch Ceramic
Flat (WD) Packages
descriptionThe ’ABT18245A scan test devices with 18-bit bus
transceivers are members of the Texas
Instruments SCOPE testability integrated-
circuit family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
In the normal mode, these devices are 18-bit noninverting bus transceivers. They can be used either as two
9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot
samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating
the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. OE can
be used to disable the device so that the buses are effectively isolated.
In the test mode, the normal operation of the SCOPE bus transceivers is inhibited and the test circuitry is
enabled to observe and control the input/output (I/O) boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1B1
1B2
GND
1B3
1B4CC
1B5
1B6
1B7
GND
1B8
1B9
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
VCC
2B8
2B9
GND
2DIR
TDO
TMS
1A1
1A2
GND
1A3
1A4CC
1A5
1A6
1A7
GND
1A8
1A9
2A1
2A2
2A3
2A4
GND
2A5
2A6
2A7
VCC
2A8
2A9
GND
2OE
TDI
TCK
