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Partno	Mfg	Dc	Qty	Available	Descript
SCAN926260TUF/NOPB \|SCAN926260TUFNOPB	NS	N/a	3911	avai	Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85

SCAN926260TUF/NOPB ,Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85Electrical Characteristics (continued)(1)Over recommended operating supply and temperature ranges u ..
SCAN926260TUFX ,3.0 V to 3.6 V, six 1 to 10 bus LVDS deserializer with IEEE 1149.1 and at-speed BISTfeatures an At-Speed Built-In Self Testn On chip filtering for PLL(BIST).Formoredetails,pleaseseeth ..
SCAN928028TUF ,8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BISTElectrical CharacteristicsOver recommended operating supply and temperature ranges unless otherwise ..
SCAN928028TUF ,8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BISTapplications. Each serializer block in the10-bit Serializer devicesSCAN928028 operates independentl ..
SCAN928028TUF/NOPB ,8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85Electrical Characteristics(1)(2)Over recommended operating supply and temperature ranges unless oth ..
SCAN92LV090SLC ,9 Channel Bus LVDS Transceiver w/ Boundary SCANfeaturesaflowthroughpinoutn High Signaling Rate Capability (above 100 Mbps)which allows easy PCB ro ..
SFR9224TM ,250V P-Channel A-FETFEATURESBV = -250 VDSS Avalanche Rugged TechnologyR = 2.4 ΩDS(on) Rugged Gate Oxide T ..
SFR9230B ,200V P-Channel MOSFETFeaturesThese P-Channel enhancement mode power field effect • -5.4A, -200V, R = 0.6Ω @V = -10 VDS(o ..
SFS2955 ,P-CHANNEL POWER MOSFETFEATURESBV = -60 VDSS! Avalanche Rugged TechnologyR = 0.3 ΩDS(on) ! Rugged Gate Oxide Techn ..
SFS9620 ,Advanced Power MOSFETFEATURESBV = -200 VDSS Avalanche Rugged TechnologyR = 1.5 ΩDS(on) Rugged Gate Oxide T ..
SFS9624 ,Advanced Power MOSFETFEATURESBV = -250 VDSS Avalanche Rugged TechnologyR = 2.4 ΩDS(on) Rugged Gate Oxide T ..
SFS9630 ,Advanced Power MOSFETFEATURESBV = -200 VDSS Avalanche Rugged TechnologyR = 0.8 ΩDS(on) Rugged Gate Oxide T ..

SCAN926260TUF/NOPB
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85
SCAN926260
www.ti.com SNLS153H–JUNE 2002–REVISED APRIL 2013
SCAN926260 Six1to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST
Checkfor Samples: SCAN926260
1FEATURES DESCRIPTION
The SCAN926260 integrates six 10-bit deserializer Deserializes Oneto Six Bus LVDS Input Serial devices intoa single chip. The SCAN926260 canData Streams with Embedded Clocks simultaneously deserializeupto six data streams that• IEEE 1149.1 (JTAG) Compliant and At-Speed have been serialized by TI’s 10-bit Bus LVDSBIST Test Modes serializers.In addition, the SCAN926260is compliant
with IEEE standard 1149.1 and also features an At-• Parallel Clock Rate 16-66MHz
Speed Built-In Self Test (BIST). For more details,• On Chip Filtering for PLL please see the sections titled IEEE 1149.1 Test• High Impedance Inputs Upon Power Off (Vcc= Modes and BIST Alone Test Modes.0V) Each deserializer blockin the SCAN926260 has it’s• Single Power Supplyat +3.3V own powerdown pin (PWRDWN[n])and operates 196-Pin NFBGA Package (Low-Profile Ball Grid independently with its own clock recovery circuitry
Array) Package and lock-detect signaling. In addition,a master
powerdown pin (MS_PWRDWN) which puts all the• Industrial Temperature Range Operation: entire device into sleep modeis provided.−40°Cto +85°C
The SCAN926260 usesa single +3.3V power supply• ROUTn[0:9] and RCLKn Default High when
and consumes 1.2Wat 3.3V witha PRBS-15 patternChannelis Not Locked onall channelsat 660Mbps.• Powerdown Per Channelto Conserve Power Unused Channels
Typical Application

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