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PSMN8R5-60YS
N-channel LFPAK 60 V, 8 m惟 standard level MOSFET
PSMN8R5-60YS
N-channel LFPAK 60 V, 8 mΩ standard level MOSFET
Rev. 01 — 22 December 2009 Product data sheet Product profile
1.1 General descriptionStandard level N-channel MOSFET in LFPAK package qualified to 175 °C. This product is
designed and qualified for use in a wide range of industrial, communications and domestic
equipment.
1.2 Features and benefits Advanced TrenchMOS provides low
RDSon and low gate charge High efficiency gains in switching
power converters Improved mechanical and thermal
characteristics LFPAK provides maximum power
density in a Power SO8 package
1.3 Applications DC-to-DC converters Lithium-ion battery protection Load switching Motor control Server power supplies
1.4 Quick reference data Table 1. Quick referenceVDS drain-source voltage Tj≥25 °C; Tj≤ 175°C - - 60 V drain current Tmb =25°C; VGS =10V;
see Figure 1
--76 A
Ptot total power
dissipation
Tmb=25 °C; see Figure 3 - - 106 W junction temperature -55 - 175 °C
Avalanche ruggednessEDS(AL)S non-repetitive
drain-source
avalanche energy
VGS =10V; Tj(init) =25°C; =76 A; Vsup≤60V;
RGS =50 Ω; unclamped
--97 mJ
Dynamic characteristicsQGD gate-drain charge VGS =10V; ID =60A;
VDS=30 V; see Figure 15 and 14
-7.7 -nC
QG(tot) total gate charge VGS =10V; ID =60A;
VDS=30 V; see Figure 14 and 15
-39 - nC
NXP Semiconductors PSMN8R5-60YS
N-channel LFPAK 60 V, 8 mΩ standard level MOSFET Pinning information Ordering information
Static characteristicsRDSon drain-source
on-state resistance
VGS =10V; ID =15A; = 100 °C; see Figure 12 - 12.8 mΩ
VGS =10V; ID =15A; Tj =25°C;
see Figure 13
-5.6 8 mΩ
Table 1. Quick reference …continued
Table 2. Pinning information source
SOT669 (LFPAK) source source gate D mounting base; connected to
drain
Table 3. Ordering informationPSMN8R5-60YS LFPAK plastic single-ended surface-mounted package (LFPAK); 4 leads SOT669
NXP Semiconductors PSMN8R5-60YS
N-channel LFPAK 60 V, 8 mΩ standard level MOSFET Limiting values
Table 4. Limiting valuesIn accordance with the Absolute Maximum Rating System (IEC 60134).
VDS drain-source voltage Tj≥25 °C; Tj≤ 175°C - 60 V
VDGR drain-gate voltage Tj≥25 °C; Tj≤ 175 °C; RGS =20kΩ -60 V
VGS gate-source voltage -20 20 V drain current VGS =10V; Tmb= 100 °C; see Figure 1 -54 A
VGS =10V; Tmb =25°C; see Figure 1 -76 A
IDM peak drain current tp≤10 µs; pulsed; Tmb =25°C; see Figure 2 -303 A
Ptot total power dissipation Tmb =25°C; see Figure 3 -106 W
Tstg storage temperature -55 175 °C junction temperature -55 175 °C
Tsld(M) peak soldering
temperature
-260 °C
Source-drain diode source current Tmb =25°C - 76 A
ISM peak source current tp≤10 µs; pulsed; Tmb =25°C - 303 A
Avalanche ruggednessEDS(AL)S non-repetitive
drain-source avalanche
energy
VGS =10V; Tj(init) =25°C; ID =76A; Vsup≤60V;
RGS =50 Ω; unclamped
-97 mJ
NXP Semiconductors PSMN8R5-60YS
N-channel LFPAK 60 V, 8 mΩ standard level MOSFET
NXP Semiconductors PSMN8R5-60YS
N-channel LFPAK 60 V, 8 mΩ standard level MOSFET Thermal characteristics
Table 5. Thermal characteristicsRth(j-mb) thermal resistance from junction to
mounting base
see Figure 4 - 0.63 1.42 K/W
NXP Semiconductors PSMN8R5-60YS
N-channel LFPAK 60 V, 8 mΩ standard level MOSFET CharacteristicsTable 6. Characteristics
Static characteristicsV(BR)DSS drain-source
breakdown voltage =250 µA; VGS =0V; Tj =-55°C 54 - - V =250 µA; VGS =0V; Tj =25°C 60 - - V
VGS(th) gate-source threshold
voltage =1mA; VDS= VGS; Tj =25 °C; see Figure 10
and 11
234 V
VGSth ID =1mA; VDS= VGS; Tj= -55 °C; see Figure 11 --4.6 V =1mA; VDS= VGS; Tj =175 °C;
see Figure 11
0.95 - - V
IDSS drain leakage current VDS =60V; VGS =0V; Tj=25°C - 0.03 2 µA
VDS =60V; VGS =0V; Tj= 125°C --50 µA
IGSS gate leakage current VGS =20V; VDS =0V; Tj=25°C - 2 100 nA
VGS =-20 V; VDS =0V; Tj=25°C - 2 100 nA
RDSon drain-source on-state
resistance
VGS =10V; ID =15A; Tj= 175 °C;
see Figure 12
-12 18.4 mΩ
VGS =10V; ID =15A; Tj= 100 °C;
see Figure 12
--12.8 mΩ
VGS =10V; ID =15A; Tj =25°C;
see Figure 13
-5.6 8 mΩ gate resistance f=1 MHz - 0.61 - Ω
Dynamic characteristicsQG(tot) total gate charge ID =60A; VDS =30V; VGS =10V;
see Figure 14 and 15
-39 - nC =0A; VDS =0V; VGS =10V - 33 - nC
QGS gate-source charge ID =60A; VDS =30V; VGS =10V;
see Figure 15 and 14 13.3 - nC
QGS(th) pre-threshold
gate-source charge =60A; VDS =30V; VGS =10V;
see Figure 14 - nC
QGS(th-pl) post-threshold
gate-source charge
-6.2 - nC
QGD gate-drain charge ID =60A; VDS =30V; VGS =10V;
see Figure 15 and 14
-7.7 - nC
VGS(pl) gate-source plateau
voltage
VDS =30V; see Figure 14 and 15 -5.2 - V
Ciss input capacitance VDS =30V; VGS=0 V; f=1 MHz; Tj =25°C;
see Figure 16 2370 - pF
Coss output capacitance - 307 - pF
Crss reverse transfer
capacitance 172 - pF
td(on) turn-on delay time VDS =30V; RL =0.5 Ω; VGS =10V;
RG(ext) =4.7Ω 18.4 - ns rise time - 13.7 - ns
td(off) turn-off delay time - 32.4 - ns
NXP Semiconductors PSMN8R5-60YS
N-channel LFPAK 60 V, 8 mΩ standard level MOSFET
Source-drain diodeVSD source-drain voltage IS =15A; VGS =0V; Tj=25 °C; see Figure 17 -0.8 1.2 V
trr reverse recovery time IS =20A; dIS/dt= -100 A/µs; VGS =0V;
VDS =30V 43.3 - ns recovered charge - 61.4 - nC
Table 6. Characteristics …continued
NXP Semiconductors PSMN8R5-60YS
N-channel LFPAK 60 V, 8 mΩ standard level MOSFET