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PMBT2222NXPN/a2850avaiNPN switching transistors
PMBT2222ANXPN/a300000avaiNPN switching transistors


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PMBT2222-PMBT2222A
NPN switching transistors
1. Product profile
1.1 General description

NPN switching transistors in a small SOT23 (TO-236AB) Surface-Mounted Device (SMD)
plastic package.
1.2 Features and benefits
High current (max. 600 mA) Low voltage (max. 40V)
1.3 Applications
Switching and linear amplification
1.4 Quick reference data

[1] Pulse test: tp≤ 300 μs; δ≤ 0.02.
PMBT2222; PMBT2222A
NPN switching transistors
Rev. 6 — 12 November 2010 Product data sheet
Table 1. Product overview

PMBT2222 SOT23 TO-236AB PMBT2907
PMBT2222A PMBT2907A
Table 2. Quick reference data

VCEO collector-emitter voltage open base
PMBT2222 - - 30 V
PMBT2222A - - 40 V collector current - - 600 mA
hFE DC current gain VCE =10V; IC= 150 mA
[1] 100 - 300
PMBT2222 VCE =10V; = 500 mA
[1] 30 - -
PMBT2222A VCE =10V; = 500 mA
[1] 40 - -
NXP Semiconductors PMBT2222; PMBT2222A
NPN switching transistors
2. Pinning information

3. Ordering information

4. Marking

[1]*= placeholder for manufacturing site code
Table 3. Pinning

1base
2emitter collector
Table 4. Ordering information

PMBT2222 - plastic surface-mounted package; 3 leads SOT23
PMBT2222A
Table 5. Marking codes

PMBT2222 *1B
PMBT2222A *1P
NXP Semiconductors PMBT2222; PMBT2222A
NPN switching transistors
5. Limiting values

[1] Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated and standard
footprint.
6. Thermal characteristics

[1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
Table 6. Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).
VCBO collector-base voltage open emitter
PMBT2222 - 60 V
PMBT2222A - 75 V
VCEO collector-emitter voltage open base
PMBT2222 - 30 V
PMBT2222A - 40 V
VEBO emitter-base voltage open collector
PMBT2222 - 5 V
PMBT2222A - 6 V collector current - 600 mA
ICM peak collector current - 800 mA
IBM peak base current - 200 mA
Ptot total power dissipation Tamb≤25°C [1] -250 mW junction temperature - 150 °C
Tamb ambient temperature −65 +150 °C
Tstg storage temperature −65 +150 °C
Table 7. Thermal characteristics

Rth(j-a) thermal resistance from
junction to ambient
in free air [1] -- 500 K/W
NXP Semiconductors PMBT2222; PMBT2222A
NPN switching transistors
7. Characteristics
Table 8. Characteristics =25 °C unless otherwise specified.
ICBO collector-base cut-off
current
PMBT2222 VCB =50V; IE =0A - - 10 nA
VCB =50V; IE =0A; = 125°C 10 μA
collector-base cut-off
current
PMBT2222A VCB =60V; IE =0A - - 10 nA
VCB =60V; IE =0A; = 125°C 10 μA
IEBO emitter-base cut-off
current
VEB =5V; IC =0A - - 10 nA
hFE DC current gain VCE =10V; =0.1 mA
VCE =10V; =1mA - -
VCE =10V; =10mA - -
VCE =10V; =10mA;
Tamb= −55°C - -
VCE =10V; = 150 mA
[1] 100 - 300
VCE =1V; = 150 mA
[1] 50 - - current gain VCE =10V; = 500 mA
[1]
PMBT2222 30 - -
PMBT2222A 40 - -
VCEsat collector-emitter
saturation voltage= 150 mA; =15mA
[1]
PMBT2222 - - 400 mV
PMBT2222A - - 300 mV
collector-emitter
saturation voltage= 500 mA; =50mA
[1]
PMBT2222 - - 1.6 V
PMBT2222A - - 1 V
NXP Semiconductors PMBT2222; PMBT2222A
NPN switching transistors

[1] Pulse test: tp≤ 300 μs; δ≤ 0.02.
VBEsat base-emitter saturation
voltage= 150 mA; =15mA
[1]
PMBT2222 - - 1.3 V
PMBT2222A 0.6 - 1.2 V
base-emitter saturation
voltage= 500 mA; =50mA
[1]
PMBT2222 - - 2.6 V
PMBT2222A - - 2 V collector capacitance VCB =10V; =ie =0A; 1MHz 8 pF emitter capacitance VEB =500 mV; =ic =0A; 1MHz
PMBT2222 - - 30 pF
PMBT2222A - - 25 pF transition frequency VCE =20V; =20mA; = 100 MHz
PMBT2222 250 - - MHz
PMBT2222A 300 - - MHz noise figure VCE =5V; = 100 μA; =1kΩ; 1kHz 4 dB delay time VCC =10V; = 150 mA;
IBon =15mA;
IBoff= −15 mA 15 ns rise time - - 20 ns
ton turn-on time - - 35 ns storage time - - 200 ns fall time - - 60 ns
toff turn-off time - - 250 ns
Table 8. Characteristics …continued
=25 °C unless otherwise specified.
NXP Semiconductors PMBT2222; PMBT2222A
NPN switching transistors
8. Test information

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
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