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PHN203N/a290avaiDual N-channel TrenchMOS logic level FET


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PHN203
Dual N-channel TrenchMOS logic level FET
PHN203
Dual N-channel TrenchMOS logic level FET
Rev. 05 — 27 April 2010 Product data sheet Product profile
1.1 General description

Dual logic level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic
package using TrenchMOS technology. This product is designed and qualified for use in
computing, communications, consumer and industrial applications only.
1.2 Features and benefits
Suitable for high frequency
applications due to fast switching
characteristics Suitable for logic level gate drive
sources
1.3 Applications
DC-to-DC converters „ Lithium-ion battery applications
1.4 Quick reference data

[1] Single device conducting.
Table 1. Quick reference data

VDS drain-source
voltage≥25 °C; Tj≤ 150°C --30 V drain current Tamb=25 °C; pulsed;
see Figure 1; see Figure 3
[1] --6.3 A
Ptot total power
dissipation
Tamb=25 °C; pulsed;
see Figure 2
[1] --2 W
Static characteristics

RDSon drain-source
on-state
resistance
VGS =10V; ID =7A; Tj =25°C;
see Figure 9; see Figure 10 2430mΩ
Dynamic characteristics

QGD gate-drain charge VGS =10V; ID =7A; VDS =15V; =25°C; see Figure 11 -nC
NXP Semiconductors PHN203
Dual N-channel TrenchMOS logic level FET Pinning information
Ordering information Limiting values
[1] Single device conducting.
Table 2. Pinning information

1S1 source1
SOT96-1 (SO8)
G1 gate1
3S2 source2 G2 gate2
5D2 drain2
6D2 drain2
7D1 drain1
8D1 drain1
Table 3. Ordering information

PHN203 SO8 plastic small outline package; 8 leads; body width 3.9 mm SOT96-1
Table 4. Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).
VDS drain-source voltage Tj≥25 °C; Tj≤ 150°C --30 V
VDGR drain-gate voltage Tj≤ 150 °C; Tj≥25 °C; RGS =20kΩ --30 V
VGS gate-source voltage -20 - 20 V drain current Tamb=70 °C; pulsed; see Figure 1 [1] --5 A
Tamb=25 °C; pulsed; see Figure 1;
see Figure 3
[1] --6.3 A
IDM peak drain current tp≤10 µs; pulsed; Tamb =25°C;
see Figure 3
[1] --18 A
Ptot total power dissipation Tamb=25 °C; pulsed; see Figure 2 [1] --2 W
Tstg storage temperature -55 - 150 °C junction temperature -55 - 150 °C
Source-drain diode
source current Tamb=25 °C; pulsed [1] --2 A
ISM peak source current tp≤10 µs; pulsed; Tamb =25°C [1] --4.1 A
Avalanche ruggedness

EDS(AL)S non-repetitive
drain-source
avalanche energy
VGS =10V; Tj(init) =25°C; ID =8.7A;
Vsup≤30 V; unclamped; tp= 0.2 ms;
RGS =50Ω - 37.8 mJ
NXP Semiconductors PHN203
Dual N-channel TrenchMOS logic level FET

NXP Semiconductors PHN203
Dual N-channel TrenchMOS logic level FET Thermal characteristics

Table 5. Thermal characteristics

Rth(j-sp) thermal resistance from
junction to solder point
---K/W
Rth(j-a) thermal resistance from
junction to ambient
mounted on a printed-circuit board;
minimum footprint; see Figure 4 - 62.5 K/W
NXP Semiconductors PHN203
Dual N-channel TrenchMOS logic level FET Characteristics

Table 6. Characteristics
Static characteristics

V(BR)DSS drain-source
breakdown voltage =250 µA; VGS =0V; Tj= -55°C 27 - - V =250 µA; VGS =0V; Tj=25°C 30 --V
VGS(th) gate-source threshold
voltage =1mA; VDS =VGS; Tj =-55 °C;
see Figure 8
--2.2 V =1mA; VDS =VGS; Tj= 150 °C;
see Figure 8
0.6 --V =1mA; VDS =VGS; Tj =25°C;
see Figure 8
11.5 2V
IDSS drain leakage current VDS =24V; VGS =0V; Tj=25°C --1 µA
VDS =24V; VGS =0V; Tj= 150°C --10 µA
IGSS gate leakage current VGS =20V; VDS =0V; Tj=25°C - 10 100 nA
VGS =-20 V; VDS =0V; Tj=25°C - 10 100 nA
RDSon drain-source on-state
resistance
VGS =10V; ID =7A; Tj =25 °C;
see Figure 9; see Figure 10 2430mΩ
VGS =4.5 V; ID= 3.5 A; Tj =25°C;
see Figure 9; see Figure 10 3055mΩ
VGS =10V; ID =7A; Tj= 150 °C;
see Figure 9; see Figure 10 40.8 51 mΩ
Dynamic characteristics

QG(tot) total gate charge ID =7A; VDS =15V; VGS =10V; =25°C; see Figure 11 14.6 - nC
QGS gate-source charge - 2 - nC
QGD gate-drain charge - 3 - nC
Ciss input capacitance VDS =20V; VGS=0 V; f=1 MHz; =25°C; see Figure 12 560 - pF
Coss output capacitance - 125 - pF
Crss reverse transfer
capacitance
VDS 20 V; VGS =0V; f=1MHz; Tj =25°C;
see Figure 12
-85 - pF
td(on) turn-on delay time VDS =25V; RL =25 Ω; VGS =10V;
RG(ext) =6 Ω; Tj =25°C -ns rise time - 6 - ns
td(off) turn-off delay time - 21 - ns fall time - 11 - ns
Source-drain diode

VSD source-drain voltage IS= 1.25 A; VGS =0V; Tj =25 °C;
see Figure 13
-0.75 1 V
trr reverse recovery time IS =2A; dIS/dt= -100 A/µs; VGS =0V;
VDS =25V; Tj =25°C
-30 - ns
NXP Semiconductors PHN203
Dual N-channel TrenchMOS logic level FET
NXP Semiconductors PHN203
Dual N-channel TrenchMOS logic level FET
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