NGB8202NT4 ,Ignition IGBT 20 A, 400 V, N-Channel D<sup>2</sup>PAKELECTRICAL CHARACTERISTICSCharacteristic Symbol Test Conditions Temperature Min Typ Max UnitON CHAR ..
NGB8206N ,Ignition IGBT, N-Channel, 20 A, 350 V, D2PAKELECTRICAL CHARACTERISTICSCharacteristic Symbol Test Conditions Temperature Min Typ Max UnitOFF CHA ..
NGB8206NTF4G , Ignition IGBT
NGD15N41CLT4 ,Ignition IGBT DPAK 15 Amps, 410 Volts, 2.1 V(max)ELECTRICAL CHARACTERISTICS (continued)Characteristic Symbol Test Conditions Temperature Min Typ Max ..
NGP15N41CL ,Ignition IGBT 15 Amps, 410 VoltsELECTRICAL CHARACTERISTICSCharacteristic Symbol Test Conditions Temperature Min Typ Max UnitOFF CHA ..
NGTB50N60FLWG , Insulated Gate Bipolar Transistor (IGBT)
NLCV25T-6R8M-PF , Inductors for Decoupling Circuits Wound/For Current NLCV/NLC series
NLCV25T-6R8M-PF , Inductors for Decoupling Circuits Wound/For Current NLCV/NLC series
NLCV32T-101K , Inductors for Decoupling Circuits
NLCV32T-1R0M-PF , SMD Inductors For Power Line
NLCV32T-1R0M-PF , SMD Inductors For Power Line
NLCV32T-1R5M , Inductors for Decoupling Circuits
NGB8202NT4
Ignition IGBT 20 A, 400 V, N-Channel D<sup>2</sup>PAK
NGB8202N
Ignition IGBT
20 A, 400 V , N−Channel D2 PAKThis Logic Level Insulated Gate Bipolar Transistor (IGBT) features
monolithic circuitry integrating ESD and Overvoltage clamped
protection for use in inductive coil drivers applications. Primary uses
include Ignition, Direct Fuel Injection, or wherever high voltage and
high current switching is required.
Features Ideal for Coil−on−Plug and Driver−on−Coil Applications Gate−Emitter ESD Protection Temperature Compensated Gate−Collector V oltage Clamp Limits
Stress Applied to Load Integrated ESD Diode Protection Low Threshold Voltage for Interfacing Power Loads to Logic or
Microprocessor Devices Low Saturation V oltage High Pulsed Current Capability Optional Gate Resistor (RG) and Gate−Emitter Resistor (RGE)
Applications Ignition Systems
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)Maximum ratings are those values beyond which device damage can occur.Maximum ratings applied to the device are individual stress limit values (notnormal operating conditions) and are not valid simultaneously. If these limits areexceeded, device functional operation is not implied, damage may occur andreliability may be affected.
