N74F30D ,8-input NAND gatePIN CONFIGURATIONTYPE TYPICAL TYPICALPROPAGATION SUPPLY CURRENTDELAY (TOTAL) Da 1 14 VCCDb 2 13 NC7 ..
N74F32D ,Quad 2-input OR gatePIN CONFIGURATION• Industrial temperature range available (–40°C to +85°C)D0a 1 14VCCD0b 2 13 D3bTY ..
N74F32N ,Quad 2-input OR gatePIN CONFIGURATION• Industrial temperature range available (–40°C to +85°C)D0a 1 14VCCD0b 2 13 D3bTY ..
N74F32N ,Quad 2-input OR gateLOGIC DIAGRAM FUNCTION TABLE 1INPUTS OUTPUTD0a32 Q0D0bDna Dnb Qn4D1a6 L L L5Q1D1bL H H9D2a 8H L HQ2 ..
N74F365D ,Buffers/driversFEATURESTYPICAL TYPICALTYPE PROPAGATION SUPPLY CURRENT• High-impedance NPN base inputs for reduced ..
N74F373D ,Octal transparent latch 3-StateFEATURES3-State output buffers. The two sections of the device are controlled• 8-bit transparent la ..
NFE61PT101Z1H9L , EMIFIL (LC Combined) Feed through Type
NFE61PT102E1H9L , EMIFIL (LC Combined) Feed through Type
NFE61PT102E1H9L , EMIFIL (LC Combined) Feed through Type
NFE61PT181B1H9L , EMIFIL (LC Combined) Feed through Type
NFE61PT181B1H9L , EMIFIL (LC Combined) Feed through Type
NFE61PT361B1H9L , EMIFIL (LC Combined) Feed through Type
N74F30D
8-input NAND gate
Product specification
IC15 Data Handbook
1989 Mar 03
Philips Semiconductors Product specification
74F308-input NAND gate
ORDERING INFORMATION
PIN CONFIGURATION
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
NOTE: One (1.0) FAST unit load is defined as: 20μA in the High state and 0.6mA in the Low state.
LOGIC DIAGRAM
FUNCTION TABLE
NOTES:H= High voltage levelL= Low voltage levelX= Don’t care
LOGIC SYMBOL
IEC/IEEE SYMBOL
Philips Semiconductors Product specification
74F308-input NAND gate
ABSOLUTE MAXIMUM RATINGS(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
RECOMMENDED OPERATING CONDITIONS
Philips Semiconductors Product specification
74F308-input NAND gate
DC ELECTRICAL CHARACTERISTICS(Over recommended operating free-air temperature range unless otherwise noted.)
NOTES: For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. All typical values are at VCC = 5V, Tamb = 25°C. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
AC WAVEFORMS
Waveform 1. Propagation Delay for Inverting Outputs
NOTE:For all waveforms, VM = 1.5V.
Philips Semiconductors Product specification
74F308-input NAND gate
TEST CIRCUIT AND WAVEFORMS
Philips Semiconductors Product specification
74F308-input NAND gate
DIP14: plastic dual in-line package; 14 leads (300 mil) SOT27-1
