N74F240D ,Octal inverting buffer (3-state)INTEGRATED CIRCUITS74F240/74F240AOctal inverter buffer (3-State)74F241/74F241AOctal buffer (3-State ..
N74F240DB ,Octal inverting buffer (3-state)PIN CONFIGURATION FOR 74F240/74F240A IEC/IEEE SYMBOL FOR 74F240/74F240AOEa 1 20 VCC1EN1Ia0 2 19 OE ..
N74F240N ,Octal inverter buffer 3-Statefeatures.• Reduced loading (74F240A I = 100μA, IL74F241A I = 40μA)ILTYPE TYPICAL PROPAGATION DELAY ..
N74F241N ,Octal buffer (3-state)features two output enables, each• Guaranteed output skew less than 2.0nscontrolling four of the 3– ..
N74F241N ,Octal buffer (3-state)FEATURES DESCRIPTIONThe 74F240 and 74F241 are octal buffers that are ideal for• Octal bus interfac ..
N74F243N ,Quad transceiver, inverting 3-StatePIN CONFIGURATIONTYPICAL TYPICALTYPE PROPAGATION SUPPLY CURRENTOE 1 14VA CCDELAY (TOTAL)NC 2 13 OEB ..
NFC15-48S05 , Single and dual output 15 Watt Wide input DC/DC converters
NFC20-24S05 , Single and dual output 20 Watt Wide input DC/DC converters
NFC20-48S05 , Single and dual output 20 Watt Wide input DC/DC converters
NFC20-48S05 , Single and dual output 20 Watt Wide input DC/DC converters
NFC20-48S05 , Single and dual output 20 Watt Wide input DC/DC converters
NFC40-48S05-M , Single and triple output 40 Watt Wide input DC/DC converters
N74F240D-N74F240DB-N74F240N-N74F241N
Octal inverter buffer 3-State
Product specification
IC15 Data Handbook
1001 Jan 02
Philips Semiconductors Product specification
74F240/74F240A/
74F241/74F241ABuffers
FEATURES• Octal bus interface
• 3-State buffer outputs sink 64mA
• 15mA source current
• Guaranteed output skew less than 2.0ns
(74F240A/74F241A)
• Reduced ground bounce (74F240A/74F241A)
• Reduced ICC (74F241A only)
• Reduced loading (74F240A IIL = 100μA,
74F241A IIL = 40μA)
DESCRIPTIONThe 74F240 and 74F241 are octal buffers that are ideal for
driving bus lines of buffer memory address registers. The
outputs are all capable of sinking 64mA and sourcing up to
15mA. The device features two output enables, each
controlling four of the 3–state outputs.
The 74F240A and 74F241A are functionally equivalent to
their non–A counterparts. They have been designed to
reduce effects of ground noise. Other advantages are noted
in the features.
ORDERING INFORMATION
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
Note to input and output loading and fan out tableOne (1.0) FAST unit load is defined as: 20μA in the high state and 0.6mA in the low state.
Philips Semiconductors Product specification
74F240/74F240A/
74F241/74F241ABuffers
PIN CONFIGURATION FOR 74F240/74F240A
LOGIC SYMBOL FOR 74F240/74F240A
IEC/IEEE SYMBOL FOR 74F240/74F240A
LOGIC DIAGRAM FOR 74F240/74F240A
FUNCTION TABLE FOR 74F240/74F240A
Notes to function table for 74F240/74F240A= High voltage level= Low voltage level= Don’t care= High impedance ”off” state
Philips Semiconductors Product specification
74F240/74F240A/
74F241/74F241ABuffers
PIN CONFIGURATION FOR 74F241/74F241A
LOGIC SYMBOL FOR 74F241/74F241A
IEC/IEEE SYMBOL FOR 74F241/74F241A
LOGIC DIAGRAM FOR 74F241/74F241A
FUNCTION TABLE FOR 74F241/74F241A
Notes to function table for 74F241/74F241A= High voltage level= Low voltage level= Don’t care= High impedance ”off” state
Philips Semiconductors Product specification
74F240/74F240A/
74F241/74F241ABuffers
ABSOLUTE MAXIMUM RATINGS(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free air temperature range.)
RECOMMENDED OPERATING CONDITIONS
Philips Semiconductors Product specification
74F240/74F240A/
74F241/74F241ABuffers
DC ELECTRICAL CHARACTERISTICS(Over recommended operating free-air temperature range unless otherwise noted.)
Notes to DC electrical characteristics For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. All typical values are at VCC = 5V, Tamb = 25°C. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
