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MMSZ4691T1 ,Plastic surface mount zener diode 500 milliwattshttp://onsemi.com3Z , DYNAMIC IMPEDANCE (Ω) θ , TEMPERATURE COEFFICIENT (mV/°C)ZT P , POWER DISSIPA ..
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MPC8050 , PASSIVE DEVICES - MMSM� Capacitors
MPC8245ARZU400D ,400MHz; V(dd): -0.3 to +2.2V; integrated processorthermal characteristics of this part, refer to the MPC8245 Integrated Processor Hardware Specificat ..
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MPC8245LZU333D , MPC8245 Integrated Processor Hardware Specifications
MPC8245LZU333D , MPC8245 Integrated Processor Hardware Specifications
MPC8245LZU333D , MPC8245 Integrated Processor Hardware Specifications
MMSZ4680T1-MMSZ4688-MMSZ4689T1-MMSZ4690-MMSZ4690T3-MMSZ4691T1-MMSZ4691T1G-MMSZ4692T1-MMSZ4697T1-MMSZ4702T1
Zener Regulator
MMSZ4678ET1 Series
Zener Voltage Regulators
500 mW SOD−123 Surface MountThree complete series of Zener diodes are offered in the convenient,
surface mount plastic SOD−123 package. These devices provide a
convenient alternative to the leadless 34−package style.
Features Pb−Free Packages are Available 500 mW Rating on FR−4 or FR−5 Board Wide Zener Reverse Voltage Range − 1.8 V to 43 V Package Designed for Optimal Automated Board Assembly Small Package Size for High Density Applications ESD Rating of Class 3 (>16 kV) per Human Body Model Peak Power − 225 W (8 x 20 �s)
Mechanical Characteristics:
CASE: Void-free, transfer-molded, thermosetting plastic case
FINISH: Corrosion resistant finish, easily solderable
MAXIMUM CASE TEMPERATURE FOR SOLDERING PURPOSES:260°C for 10 Seconds
POLARITY: Cathode indicated by polarity band
FLAMMABILITY RATING: UL 94 V−0
MAXIMUM RATINGSMaximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits
are exceeded, device functional operation is not implied, damage may occur
and reliability may be affected. Nonrepetitive current pulse per Figure 11. FR−5 = 3.5 x 1.5 inches, using the minimum recommended footprint. Thermal Resistance measurement obtained via infrared Scan Method.