MJE270 , 15.000W Darlington NPN Plastic Leaded Transistor. 100V Vceo, 4.000A Ic, 500 hFE.ELECTRICAL CHARACTERISTICS (T = 25C unless otherwise noted)CCharacteristic Symbol Min Max UnitOFF ..
MJE270 , 15.000W Darlington NPN Plastic Leaded Transistor. 100V Vceo, 4.000A Ic, 500 hFE.
MJE271 ,Power 2A 100V PNP2h , DC CURRENT GAINFEI , COLLECTOR CURRENT (AMPS)CMJE270 (NPN), MJE271 (PNP)PACKAGE DIMENSIONSTO−2 ..
MJE271 ,Power 2A 100V PNP
MJE2955T ,Leaded Power Transistor General PurposeTHERMAL CHARACTERISTICSCharacteristic Symbol Max UnitThermal Resistance, Junction to Case θ 1.67 C ..
MJE2955TG , Complementary Silicon Plastic Power Transistors
MM74HC244WMX ,Octal 3-STATE BufferMM74HC244 Octal 3-STATE BufferSeptember 1983Revised August 2000MM74HC244Octal 3-STATE Buffer
MM74HC245AMTC ,Octal 3-STATE TransceiverFeaturesspeed operation even when driving large bus capaci-tances. This circuit possesses the low p ..
MM74HC245AMTC ,Octal 3-STATE TransceiverGeneral Descriptionhave Schmitt trigger inputs. All inputs are protected fromThe MM74HC245A 3-STATE ..
MM74HC245AMTC ,Octal 3-STATE TransceiverFeaturesspeed operation even when driving large bus capaci-tances. This circuit possesses the low p ..
MM74HC245AMTCX ,Octal 3-STATE TransceiverMM74HC245A Octal 3-STATE TransceiverSeptember 1983Revised February 1999MM74HC245AOctal 3-STATE Tran ..
MM74HC245AN ,Octal 3-STATE TransceiverMM74HC245A Octal 3-STATE TransceiverSeptember 1983Revised February 1999MM74HC245AOctal 3-STATE Tran ..
MJE270-MJE271
Power 2A 100V PNP
MJE270 (NPN), MJE271
(PNP)
Complementary Silicon
Power Transistors High Safe Operating Area
IS/B @ 40 V , 1.0 s = 0.375 A Collector−Emitter Sustaining V oltage
VCEO(sus) = 100 Vdc (Min) High DC Current Gain
hFE @ 120 mA, 10 V = 1500 (Min)
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Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not normal
operating conditions) and are not valid simultaneously. If these limits are exceeded,
device functional operation is not implied, damage may occur and reliability may be
affected.
