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LMH6628MANSN/a162avaiDual Wideband, Low Noise, Voltage Feedback Op Amp


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LMH6628MA
Dual Wideband, Low Noise, Voltage Feedback Op Amp
Original Creation Date: 04/29/03
Last Update Date: 05/13/03
Last Major Revision Date: MNLMH6628-X-RH REV 0A0
MICROCIRCUIT DATA SHEET
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP,
GUARANTEED TO 300k rd(Si) TESTED TO MIL-STD-883,
METHOD 1019
General Description

The National LMH6628 is a high speed dual op amp that offers a traditional voltage
feedback topology featuring unity-gain stability and slew-enhanced circuitry. The
LMH6628's low noise and very low harmonic distortion combine to form a very wide dynamic
range op amp that operates from a single (5 to 12V) or dual (+5V) power supply.
Each of the LMH6628's closely matched channels provides a 300MHz unity gain bandwidth and
low input voltage noise density (2nV/SqRtHz). Low 2nd/3rd harmonic distortion (-65/-74dBc
at 10MHz) makes the LMH6628 a perfect wide dynamic-range amplifier for matched I/Q
channels.
With its fast and accurate settling (12ns to 0.1%), the LMH6628 is also an excellent
choice for wide dynamic range, anti-aliasing filters to buffer the inputs of hi resolution
analog-to-digital converters. Combining the LMH6628's two tightly matched amplifiers in a
single package reduces cost and board space for many composite amplifier applications such
as active filters, differential line drivers/receivers, fast peak detectors and
instrumentation amplifiers.
The LMH6628 is fabricated using National's VIP 10 (TM) comlimentary bipolar process.
NS Part Numbers

LMH6628J-QML
LMH6628J-QMLV
LMH6628JFQML
LMH6628JFQMLV
LMH6628WG-QML
LMH6628WG-QMLV
LMH6628WGFQML
LMH6628WGFQMLV
Industry Part Number

LMH6628
Prime Die

LMH6628A
Controlling Document

SEE FEATURES SECTION
Processing

MIL-STD-883, Method 5004
Quality Conformance Inspection

MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
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