LM6172IMX ,Dual High Speed, Low Power, Low Distortion Voltage Feedback Amplifiersapplications tokeep all component leads short because wires are inductive at high frequency. For di ..
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LP38692SD-ADJ ,1A Low Dropout CMOS Linear Regulators with Adjustable OutputApplicationsGround Pin Current: 55 µA (typ) at full load.n Hard Disk DrivesAdjust Pin Voltage: 2.5% ..
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LP38692SDX-2.5 ,1A Low Dropout CMOS Linear RegulatorsApplications@Dropout Voltage: 450 mV (typ) 1A (typ. 5V out).n Hard Disk DrivesGround Pin Current: 5 ..
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LM6172IMX
Dual High Speed, Low Power, Low Distortion Voltage Feedback Amplifiers
Original Creation Date: 07/19/01
Last Update Date: 08/13/01
Last Major Revision Date:
MNLM6172AM-X-RH REV 0A0
MICROCIRCUIT DATA SHEET
DUAL HIGH SPEED, LOW POWER, VOLTAGE FEEDBACK
AMPLIFIERS: ALSO AVAILABLE GUARANTEED TO 300k RAD (Si)
TESTED TO MIL-STD-883, METHOD 1019.5
General DescriptionThe LM6172 is a dual high speed voltage feedback amplifier. It is unity-gain stable and
provides excellent DC and AC performance. With 100 MHz unity-gain bandwidth, 3000V/uS slew
rate and 50mA of output current per channel, the LM6172 offers high performance in dual
amplifiers; yet it consumes only 2.3 mA of supply current per amplifier.
The LM6172 operates on +15V power supply for systems requiring large voltage swings, such
as ADSL, scanners and ultrasound equipment. It is also specified at +5V power supply for
low voltage applications such as portable video systems.
The LM6172 is built with National's advanced VIP[TM]III (Vertically Integrated PNP)
complementary bipolar process.
NS Part NumbersLM6172AMJ-QML
LM6172AMJ-QMLV
LM6172AMJFQML
LM6172AMJFQMLV
LM6172AMWG-QML
LM6172AMWG-QMLV
LM6172AMWGFQML
LM6172AMWGFQMLV
Industry Part NumberLM6172
Prime DieLM6172
Controlling DocumentSEE FEATURES SECTION
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
