LF444CM ,Quad Low Power JFET Input Operational AmplifierMICROCIRCUIT DATA SHEETOriginal Creation Date: 06/21/95MNLF444M-X REV 0ALLast Update Date: 02/17/97 ..
LF444CMX ,Quad Low Power JFET Input Operational AmplifierMICROCIRCUIT DATA SHEETOriginal Creation Date: 06/21/95MNLF444M-X REV 0ALLast Update Date: 02/17/97 ..
LF444CN ,LOW POWER JFET INPUT OPERATIONAL AMPLIFIERSMICROCIRCUIT DATA SHEETOriginal Creation Date: 06/21/95MNLF444M-X REV 0ALLast Update Date: 02/17/97 ..
LF444CN .. ,LOW POWER JFET INPUT OPERATIONAL AMPLIFIERSMICROCIRCUIT DATA SHEETOriginal Creation Date: 06/21/95MNLF444M-X REV 0ALLast Update Date: 02/17/97 ..
LF444CN. ,LOW POWER JFET INPUT OPERATIONAL AMPLIFIERSMICROCIRCUIT DATA SHEETOriginal Creation Date: 06/21/95MNLF444M-X REV 0ALLast Update Date: 02/17/97 ..
LF444MD , LF444QML Quad Low Power JFET Input Operational Amplifier
LM211DR ,Single, Strobed Differential Comparator with Open Collector and Emitter OutputsFeatures with Military Disclaimer........ 1• Added Applications, Device Information table, Pin Conf ..
LM211DR2 ,Single ComparatorMaximum ratings applied to the device are individual stress limitvalues (not normal operating condi ..
LM211DR2G , Single Comparators
LM211DRG4 ,Differential Comparator With Strobes 8-SOIC -40 to 85Features 3 DescriptionThe LM111, LM211, and LM311 devices are single1• Fast Response Time: 165 nshi ..
LM211DT ,VOLTAGE COMPARATORSLM111 LM211 - LM311VOLTAGE COMPARATORS■ MAXIMUM INPUT CURRENT : 150nA ■ MAXIMUM OFFSET CURREN ..
LM211H ,Voltage ComparatorLM111/LM211/LM311 Voltage ComparatorJanuary 2001LM111/LM211/LM311Voltage Comparatorthe devices are ..
LF444ACN-LF444CM-LF444CMX-LF444CN-LF444CN ..-LF444CN.
Quad Low Power JFET Input Operational Amplifier
Original Creation Date: 06/21/95
Last Update Date: 02/17/97
Last Major Revision Date: 06/21/95
MNLF444M-X REV 0AL
MICROCIRCUIT DATA SHEET
QUAD LOW POWER JFET INPUT OPERATIONAL AMPLIFIER
NS Part NumbersLF444MD/883
Industry Part NumberLF444
Prime DieLF444
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
