JM38510/R75001BDA ,Quad 2-Input NAND GateGeneral DescriptionThe 'AC00 contains four 2-input NAND gates. Industry Part Number NS Part Numbers ..
JM38510/R75001SCA ,Quad 2-Input NAND Gate54AC00/54ACT00 Quad 2-Input NAND GateJuly 200354AC00/54ACT00Quad 2-Input NAND Gaten Standard Microc ..
JM38510/R75002BDA ,Triple 3-Input NAND GateMILITARY DATA SHEETOriginal Creation Date: 06/27/96MN54AC10-X REV 1A0Last Update Date: 09/11/96Last ..
JM38510/R75202BDA ,Quad 2-input Exclusive-OR Gate
JM38510/R75503BSA ,Octal Bidirectional Transceiver with TRI-STATE Inputs/ Outputsapplications. Current sinking capability is 24 mA at the A andB ports. The Transmit/Receiver (T/R ..
JM3851066309BCA ,Dual 4-Bit Binary Counters SCLS143D − DECEMBER 1982 − REVISED JULY 2003SN54HC393 .. ..
KA3010D ,15V; 1.7W; 4-channel motor driverCD-ROM PRODUCTS KA3010D28-SSOPH-375The KA3010D is a monolithic integrated circuit, and suitable for ..
KA3010D ,15V; 1.7W; 4-channel motor driverCD-ROM PRODUCTS KA3010D28-SSOPH-375The KA3010D is a monolithic integrated circuit, and suitable for ..
KA3010D ,15V; 1.7W; 4-channel motor driverBLOCK DIAGRAM))+AA(( OII-OIGGIOO12----------DSPP4444CC3333ANHHHHICCHHHHMMGCCCCBVVCCCCAA2618171610k ..
KA3011 ,3-Phase BLDC Motor DriverFeatures Description• 3-phase, full-wave, linear BLDC motor driver The KA3011BD is a monolithic IC, ..
KA3011BD ,3-Phase BLDC Motor DriverApplications Ordering Information• Compact disk ROM (CD-ROM) spindle motorDevice Package Operating ..
KA3011BD ,3-Phase BLDC Motor DriverApplications Ordering Information• Compact disk ROM (CD-ROM) spindle motorDevice Package Operating ..
JM38510/R75001BDA
Quad 2-Input NAND Gate
Original Creation Date: 06/27/96
Last Update Date: 03/31/97
Last Major Revision Date: 06/27/96
MN54AC00-X REV 1B0
MICROCIRCUIT DATA SHEET
Quad 2-Input NAND Gate
General DescriptionThe 'AC00 contains four 2-input NAND gates.
NS Part Numbers54AC00DMQB
54AC00FMQB
54AC00LMQB
Industry Part Number54AC00
Prime DieZ000
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 C Static tests at +125C Static tests at -55 C Dynamic tests at +25 C Dynamic tests at +125C Dynamic tests at -55 C Functional tests at +25 C Functional tests at +125C Functional tests at -55 C Switching tests at +25 C Switching tests at +125C Switching tests at -55 C