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JM38510/12501BGA-LF198H-LF198H/883.
Monolithic Sample and Hold Circuit
Original Creation Date: 07/20/95
Last Update Date: 11/02/00
Last Major Revision Date: 08/02/00
MJLF198-X REV 2B0
MICROCIRCUIT DATA SHEET
SAMPLE AND HOLD CIRCUIT, 10K OHM LOAD
General DescriptionThe LF198 is a monolithic sample-and-hold circuit which utilize BI-FET technology to
obtain ultra-high dc accuracy with fast acquisition of signal and low droop rate.
Operating as a unity gain follower, dc gain accuracy is 0.002% typical and acquisition
time is as low as 6 us to 0.01%. A bipolar input stage is used to achieve low offset
voltage and wide bandwidth. Input offset adjust is accomplished with a single pin, and
does not degrade input offset drift. The wide bandwidth allows the LF198 to be included
inside the feedback loop of 1 MHz op amps without having stability problems. Input
impedance of 10(10) ohms allows high source impedances to be used without degrading
accuracy.
P-channel junction FETs are combined with bipolar devices in the output amplifier to give
droop rates as low as 5 mV/min with a 1uF hold capacitor. The JFETs have much lower noise
than MOS devices used in previous designs and do not exhibit high temperature
instabilities. The overall design guarantees no feed-through from input to output in the
hold mode, even for input signals equal to the supply voltages.
Logic inputs on the LF198 are fully differential with low input current, allowing direct
connection to TTL, PMOS, and CMOS. Differential theshold is 1.4V. The LF198 will operate
from +5V to +18V supplies.
NS Part NumbersJL198BGA
JL198SGA
Industry Part NumberLF198
Prime DieLF198
Controlling Document38510/12501
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55