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JM38510/10107BGA |JM3851010107BGALTN/a1avaiOperational Amplifier


JM38510/10107BGA ,Operational Amplifierapplications, feedforward compensation will boost theslew rate to over 150V/uS and almost double th ..
JM38510/10107BHA ,Operational AmplifierFeatures- 15 MHz small signal bandwidth - Guaranteed 50V/uS slew rate - Maximum bias current of 250 ..
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JM38510/10107BGA
Operational Amplifier
Original Creation Date: 06/30/95
Last Update Date: 03/23/00
Last Major Revision Date: 02/29/00MNLM118-X REV 0A0
MICROCIRCUIT DATA SHEET
OPERATIONAL AMPLIFIER
General Description

The LM118 is a precision high speed operational amplifier designed for applications
requiring wide bandwith and high slew rate. It features a factor of ten increase in speed
over general purpose devices without sacrificing DC performance.
The LM118 has internal unity gain frequency compensation. This considerably simplifies
its application since no external components are necessary for operation. However, unlike
most internally compensated amplifiers, external frequency compensation may be added for
optimum performance. For inverting applications, feedforward compensation will boost the
slew rate to over 150V/uS and almost double the bandwidth. Overcompensation can be used
with the amplifier for greater stability when maximum bandwidth is not needed. Further, a
single capacitor can be added to reduce the 0.1% settling time to under 1uS.
The high speed and fast settling time of these op amps make them useful in A/D converters,
oscillators, active filters, sample and hold circuits, or general purpose amplifiers.
This devices is easy to apply and offers an order of magnitude better AC performance than
industry standards such as the LM709.
NS Part Numbers

LM118H/883
LM118J-8/883
LM118J/883
LM118WG/883
Industry Part Number

LM118
Prime Die

LM118
Processing

MIL-STD-883, Method 5004
Quality Conformance Inspection

MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
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