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JM38510/10103SPA-LM101AJ/883
Operational Amplifier
Original Creation Date: 01/20/00
Last Update Date: 09/17/03
Last Major Revision Date: 07/18/02
MRLM101A-X-RH REV 1B2
MICROCIRCUIT DATA SHEET
SINGLE OPERATIONAL AMPLIFIER - EXTERNALLY COMPENSATED:
ALSO AVAILABLE GUARANTEED TO 100k rd(Si) TESTED TO
MIL-STD-883, METHOD 1019
General DescriptionThe LM101A is a general purpose operational amplifier which features improved performance
over industry standards such as the LM709. Advanced processing techniques make possible
an order of magnitude reduction in input currents, and a redesign of the biasing circuitry
reduces the temperature drift of input current.
This amplifier offers many features which make its application nearly foolproof: overload
protection on the input and output, no latch-up when the common mode range is exceeded,
and freedom from oscillations and compensation with a single 30 pF capacitor. It has
advantages over internally compensated amplifiers in that the frequency compensation can
be tailored to the particular application. For example, in low frequency circuits it can
be overcompensated for increased stability margin. Or the compensation can be optimized
to give more than a factor of ten improvement in high frequency performance for most
applications.
In addition, the device provides better accuracy and lower noise in high impedance
circuitry. The low input currents also make it particularly well suited for long interval
integrators or timers, sample and hold circuits and low frequency waveform generators.
Further, replacing circuits where matched transistor pairs buffer the inputs of
conventional IC op amps, it can give lower offset voltage and a drift at a lower cost.
NS Part NumbersLM101AH-QMLV
LM101AHRQMLV
LM101AJ-QMLV
LM101AW-QMLV
LM101AWRQMLV
Industry Part NumberLM101A
Prime DieLM101A
Controlling DocumentSEE FEATURES SECTION
ProcessingMIL-STD-883, Method 5004
Quality Conformance InspectionMIL-STD-883, Method 5005
Subgrp Description Temp ( C)o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
